6 件のレコードが見つかりました。
Au13 Superatom Bearing Two Terpyridines at Coaxial Positions: Photoluminescence Quenching via Complexation with 3d Metal Ions
- ジャーナル論文
- 著者
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;Naoki Kito (author) (この著者で検索);Shinjiro Takano (author) (この著者で検索);Shinya Masuda (author) (この著者で検索)Koji Harano (author) (この著者で検索)
;
Tatsuya Tsukuda (author) (この著者で検索) - キーワード
- superatom, transmission electron microscopy, photoluminescence, nanocluster, gold
- 刊行年月日
- 2023-09-15
- 更新時刻
- 2024-01-05 22:11:46 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
- ジャーナル論文
- 著者
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;Yudai Yamaguchi (author) (この著者で検索);Yuta Inaba (author) (この著者で検索);Ryoji Arai (author) (この著者で検索);Yuya Kanitani (author) (この著者で検索);Yoshihiro Kudo (author) (この著者で検索);Michinori Shiomi (author) (この著者で検索);Daiji Kasahara (author) (この著者で検索);Mikihiro Yokozeki (author) (この著者で検索);Noriyuki Fuutagawa (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
;Kouichi Akahane (author) (この著者で検索);Naokatsu Yamamoto (author) (この著者で検索)Shigetaka Tomiya (author) (この著者で検索)
- キーワード
- quantum dot, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2024-04-11
- 更新時刻
- 2025-04-14 16:30:23 +0900
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
;Yuanzhao Yao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)
;
Takashi Sekiguchi (author) (この著者で検索)
- キーワード
- transmission electron microscopy, scanning electron microscopy, focused ion beam
- 刊行年月日
- 2025-08-01
- 更新時刻
- 2026-01-31 16:30:04 +0900
Multiprobe analyses on nucleation and evolution of nanocrystallization process in a high saturation magnetization soft magnetic Fe–Si–B–P–Cu–C alloy
- ジャーナル論文
- 著者
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Shozo Hiramoto (author) (この著者で検索)
https://orcid.org/0009-0004-3985-2718
(unauthenticated)
;
;Satoshi Okamoto (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
;Akihiko Toda (author) (この著者で検索);Sangwook Kim (author) (この著者で検索);Chikako Moriyoshi (author) (この著者で検索)Yoshihiro Kuroiwa (author) (この著者で検索) - キーワード
- atom probe tomography, transmission electron microscopy, nanocrystalline soft magnetic material
- 刊行年月日
- 2025-02-10
- 更新時刻
- 2026-02-11 08:30:29 +0900
Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam
- ジャーナル論文
- 著者
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;Shuai Tang (author) (この著者で検索)Jie Tang (author) (この著者で検索)
;
;Yimeng Wu (author) (この著者で検索);You-Hu Chen (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Masaki Takeguchi (author) (この著者で検索)
;
Lu-Chang Qin (author) (この著者で検索)
- キーワード
- electron emission, transmission electron microscopy, focused ion beam
- 刊行年月日
- 2025-03-06
- 更新時刻
- 2025-04-12 08:30:10 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
;
Jun Chen (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
;
;Ryo Tanaka (author) (この著者で検索)Fuji Electric Corporation;Shinya Takashima (author) (この著者で検索)Fuji Electric Corporation;Masaharu Edo (author) (この著者で検索)Fuji Electric CorporationTadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
;
Takashi Sekiguchi (author) (この著者で検索)University of Tsukuba
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
- 刊行年月日
- 2024-08-07
- 更新時刻
- 2024-08-03 08:30:15 +0900