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0906Nb#1.png
Original dataset for ID 1 Nb in Thermophysical Property Database
データセット
コレクション
Thermophysical Property Original Datasets
著者
Takehiko Ishikawa (depositor) (この著者で検索)
Japan Aerospace Exploration Agency
;
Masashi Ishii (editor) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Nb, Metal, Density, VELF, Electrostatic Levitation, collection - Thermophys Datasets
刊行年月日
更新時刻
2024-03-30 18:34:17 +0900
sciadv.adg3289_sm.pdf
Neuromorphic learning, working memory, and metaplasticity in nanowire networks
ジャーナル論文
著者
Alon Loeffler (author) (この著者で検索)
The University of Sydney School of Physics
;
Adrian Diaz-Alvarez (author) (この著者で検索)
NIMS International Center for Young Scientists (ICYS)
;
Ruomin Zhu (author) (この著者で検索)
The University of Sydney School of Physics
;
Natesh Ganesh (author) (この著者で検索)
National Institute of Standards and Technology (NIMS)
;
James M. Shine (author) (この著者で検索)
The University of Sydney School of Physics
;
Tomonobu Nakayama (author) (この著者で検索)
NIMS International Center for Materials Nanoarchitectonics (MANA)
ORCID SAMURAI ;
Zdenka Kuncic (author) (この著者で検索)
The University of Sydney School of Physics
キーワード
Neuromorphic, Silver nanowire network, neurosynaptic connectivity, emergent dynamics, metaplasticity, learning, memory
刊行年月日
2023-04-21
更新時刻
2024-01-05 22:11:55 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Dataset
SuperCon RDF Ver. 1.0
データセット
コレクション
SuperCon Knowledge Collection
著者
Masashi Ishii (author) (この著者で検索)
National Institute for Materials Science
キーワード
SuperCon, Superconductors, RDF, Ontology, Semantic Web, SPARQL
刊行年月日
更新時刻
2023-12-25 00:32:34 +0900
schematic of the data contained in the folders.PNG
Sample data for X-ray visualization of local bending of the lattice planes (XR-V-LBLP)
データセット
著者
YAGYU, Shinjiro (curator) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
X-ray diffraction topography
刊行年月日
2023-03-27
更新時刻
2023-03-27 16:02:33 +0900
GaN_H2O.jpg
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
刊行年月日
2022-12-31
更新時刻
2024-01-05 22:11:14 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
GaN_O2.jpg
Continuous real-time O 1s core XPS spectra of initial O2 molecule adsorption on polar and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
GaN, Gallium nitride, Oxidation, Adsorption, XPS, SPring-8
刊行年月日
2020-11-19
更新時刻
2024-01-05 22:13:22 +0900
Dataset
MaterialBERT for Natural Language Processing of Materials Science Texts
ジャーナル論文
著者
KAWANO, Hiroyuki (author) (この著者で検索)
Ridgelinez Limited
;
SATO, Fumitaka (author) (この著者で検索)
Ridgelinez Limited
;
YOSHITAKE, Michiko (author) (この著者で検索)
National Institute for Materials Science MaDIS
ORCID SAMURAI ;
MOTEKI, Fuma (operator) (この著者で検索)
Ridgelinez Limited
;
TERAOKA, Hiroshi (author) (この著者で検索)
Ridgelinez Limited
キーワード
word embedding, pre-training, BERT, literal information
刊行年月日
更新時刻
2025-04-15 08:30:11 +0900
HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900