資源タイプ: ジャーナル論文
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3738 件のレコードが見つかりました。

Vol.25_No.3_2019.pdf
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
キーワード
Auger Depth Profiling Analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
刊行年月日
2020-06-04
更新時刻
2022-10-03 01:48:14 +0900
Vol.1_No.3_374-387.pdf
InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告（I）
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI
キーワード
Auger Depth Profiling Analysis, InP/GaInAs Specimen, Round Robin Test
刊行年月日
1995-11-16
更新時刻
2022-10-03 01:55:14 +0900
Vol.2_No.1_59-64.pdf
試料冷却法を併用したAES深さ方向分析によるSiO2/Si熱酸化膜の分析
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI
キーワード
Auger Depth Profiling Analysis, SiO2/Si, Sample Cooling Method
刊行年月日
1996-02-08
更新時刻
2022-10-03 01:39:59 +0900
10.1080_14686996.2020.1738268.pdf
Data-based selection of creep constitutive models for high-Cr heat-resistant steel
ジャーナル論文
著者
Izuno, Hitoshi (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Demura, Masahiko (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Tabuchi, Masaaki (author) (この著者で検索)
National Institute for Materials Science Research Center for Structural Materials
ORCID SAMURAI ;
Mototake, Yoh-ichi (author) (この著者で検索)
The Institute of Statistical Mathematics
;
Okada, Masato (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
キーワード
theta method, Creep constitutive equation, model selection method, bayesian free energy, steady-state creep, grade 91 steel
刊行年月日
2020-01-31
更新時刻
2024-01-05 22:12:23 +0900
10.1038_s41598-020-65945-7.pdf
A universal Bayesian inference framework for complicated creep constitutive equations
ジャーナル論文
著者
Izuno, Hitoshi (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Mototake, Yoh-ichi (author) (この著者で検索)
The Institute of Statistical Mathematics
;
Nagata, Kenji (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Demura, Masahiko (author) (この著者で検索)
National Institute for Materials Science Research and Services Division of Materials Data and Integrated System
ORCID SAMURAI ;
Okada, Masato (author) (この著者で検索)
University of Tokyo Graduate School of Frontier Sciences
キーワード
Materials science, Metals and alloys, Structural materials
刊行年月日
2020-06-26
更新時刻
2024-01-05 22:13:52 +0900
JCP21-AR-COMMA2021-00971.pdf
Combination of recommender system and single-particle diagnosis for accelerated discovery of novel nitrides
ジャーナル論文
著者
ORCID SAMURAI ;
SEKO, Atsuto (author) (この著者で検索)
ORCID ;
TANAKA, Isao (author) (この著者で検索)
ORCID ; ORCID SAMURAI ; ORCID SAMURAI
キーワード
materials informatics, density functional theory calculation, materials search
刊行年月日
2021-06-14
更新時刻
2024-01-05 22:12:06 +0900
JSA_Vol18_No3_174.pdf
High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ;
Kim, Kyung Joong (author) (この著者で検索)
ORCID ;
Nagatomi, Takaharu (author) (この著者で検索)
ORCID
キーワード
Auger Depth Profiling Analysis, Si/Ge multiple delta-doped layers, GaAs/AlAs Superlattice, Inclined Holder
刊行年月日
2016-04-03
更新時刻
2024-01-05 22:13:47 +0900
JSA_Vol25_14-20.pdf
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
ジャーナル論文
著者
ORCID SAMURAI ;
Yanagiuchi, Katsuaki (author) (この著者で検索)
ORCID ; ORCID SAMURAI
キーワード
Ultra Low Angle Incidence Ion Beam, FeNi/CoFeB/FeNi Thin Film, Auger Depth Profiling Analysis
刊行年月日
2019-03-31
更新時刻
2024-01-05 22:13:23 +0900
JSA_Vol.1_No.1_36-42.pdf
Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI
キーワード
argon ion sputtering, compound semiconductor, surface observation using a scanning electron microscope
刊行年月日
1995-03-08
更新時刻
2022-10-03 01:31:38 +0900
JSA_Vol.1_No.2_227-233.pdf
InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI
キーワード
Auger Depth Profiling Analysis, Depth Resolution, Sample Temperature, InP/GaInAsP多層膜
刊行年月日
1995-05-17
更新時刻
2022-10-03 01:44:22 +0900