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Determination of Inelastic Mean Free Paths in Elemental Solids in the 200 to 5000 eV ...
オージェ電子分光法における背面散乱補正 I．広い分析条件で使用可能な電子の背面散乱補正式の開発
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auge...
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Auger electron spectroscopy
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一般社団法人 表面分析研究会
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Goto, K
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Kimura, T
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JOURNAL OF SURFACE ANALYSIS
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Surface and Interface Analysis
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