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TANUMA, Shigeo
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Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auge...
First-principles calculations of optical constants
Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spect...
Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Usi...
Auger Depth Profiling Analyses of InP/GaInAsP Multilayers
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Qu...
先端共用施設・技術プラットフォームの展望と課題 − ナノテクノロジープラットフォーム事業をベースとして −
Inelastic Scattering of Electrons in Solids
Energy Dependence of Electron Stopping Powers in Elemental Solids over the 100 eV to 3...
Calculations of electron inelastic mean free paths.VIII. Data for 15 elemental solids ...
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13
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Keyword
IMFP
5
Auger depth profiling analysis
3
EPES
2
Fano Plot
2
InP/GaInAsP multilayer specimens
2
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Language
English
8
Japanese
5
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National Institute for Materials Science
5
Surface Science Society of Japan
4
Wiley
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Article
7
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14
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Creative Commons BY-NC Attribution-NonCommercial 4.0 International
7
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Creative Commons BY Attribution 4.0 International
1
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
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Computational methods
density functional theory or electronic structure
1
Data origin
simulations
1
Properties addressed
electrical -- dielectric constant and spectra
1
optical
1
Material/Specimen
InP/GaInAsP multilayer specimens
2
GaAs/AlAs multilayer
1
InP/GaInAsP Multilayer
1
Date created
2021
1
Author
TANUMA, Shigeo
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14
OGIWARA, Toshiya
4
C.J. Powell
2
SHINOTSUKA, Hiroshi
2
YOSHIKAWA, Hideki
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http://rightsstatements.org/vocab/InC/1.0/
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Journal
Journal of The Surface Science Society of Japan
4
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
1
SURFACE AND INTERFACE ANALYSIS
1
Surface and Interface Analysis
1
e-Journal of Surface Science and Nanotechnology
1