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TANUMA, Shigeo
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Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Usi...
Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spect...
First-principles calculations of optical constants
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auge...
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Type of work
Publication
13
Dataset
1
Keyword
IMFP
5
Auger depth profiling analysis
3
EPES
2
Fano Plot
2
InP/GaInAsP multilayer specimens
2
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Language
English
8
Japanese
5
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National Institute for Materials Science
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Surface Science Society of Japan
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Wiley
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Article
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Creative Commons BY-NC Attribution-NonCommercial 4.0 International
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Creative Commons BY Attribution 4.0 International
1
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
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Computational methods
density functional theory or electronic structure
1
Data origin
simulations
1
Properties addressed
electrical -- dielectric constant and spectra
1
optical
1
Material/Specimen
InP/GaInAsP multilayer specimens
2
GaAs/AlAs multilayer
1
InP/GaInAsP Multilayer
1
Date created
2021
1
Author
TANUMA, Shigeo
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14
OGIWARA, Toshiya
4
C.J. Powell
2
SHINOTSUKA, Hiroshi
2
YOSHIKAWA, Hideki
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http://rightsstatements.org/vocab/InC/1.0/
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Journal
Journal of The Surface Science Society of Japan
4
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
1
SURFACE AND INTERFACE ANALYSIS
1
Surface and Interface Analysis
1
e-Journal of Surface Science and Nanotechnology
1