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田沼 繁夫
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電子の非弾性平均自由行程の一般式:JTP 式の開発
10eV - 30 keVにおける固体中の電子阻止能の計算
モノづくりを支える表面分析技術: 表面分析の現状とその課題
TWA2 表面分析化学 2005年度のプロジェクトの概要と進捗
Inelastic Mean Free Paths, Mean Escape Depths, and Effective Attenuation Lengths for S...
電子分光法における表面定量分析の標準化の歩み
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National Institute for Materials Science
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田沼 繁夫
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