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Journal of Surface Analysis
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English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysi...
表面電子分光法における信号の減衰はいかに記述されるか? II. 誘電関数とIMFP
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence ...
Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
電子線マイクロアナライザーによるMg-Ge合金の定量 -Mg Kαに対するGeの質量吸収係数の検討- and Electron microprobe analysis of...
InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告(I)
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle In...
High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Hol...
Estimation of Inelastic Mean Free Paths in Au and Cu from Their Elastic Peak Intensity...
べき乗則で解釈されるスペクトルの閾値及びべき乗数の自動解析方法
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Auger Depth Profiling Analysis
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Ultra Low Angle Incidence Ion Beam
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HfO2/Si
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Au and Cu
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Auger Depth Profiling analysis
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Japanese
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Surface Analysis Society of Japan
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National Institute for Materials Science
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表面分析研究会
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
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HfO2
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FeNi/CoFeB/FeNi Thin Film
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GaAs
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GaAs/AlAs Superlattice
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Ogiwara, Toshiya
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Tanuma, Shigeo
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Yoshikawa, Hideki
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Nagata, Takahiro
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H. Yoshikawa
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Journal of Surface Analysis
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