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TANUMA, Shigeo
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Calculations of electron inelastic mean free paths.VIII. Data for 15 elemental solids ...
Energy Dependence of Electron Stopping Powers in Elemental Solids over the 100 eV to 3...
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Qu...
Auger Depth Profiling Analyses of InP/GaInAsP Multilayers
Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Usi...
Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spect...
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auge...
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Auger depth profiling analysis
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InP/GaInAsP multilayer specimens
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AES
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Argon Ion Spot Beam
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Auger Depth Profiling Analysis
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Japanese
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Surface Science Society of Japan
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Creative Commons BY-NC Attribution-NonCommercial 4.0 International
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Material/Specimen
InP/GaInAsP multilayer specimens
2
GaAs/AlAs multilayer
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InP/GaInAsP Multilayer
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Author
TANUMA, Shigeo
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OGIWARA, Toshiya
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C.J. Powell
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D.R. Penn
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HARADA, Tomoko
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Journal of The Surface Science Society of Japan
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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS
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SURFACE AND INTERFACE ANALYSIS
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Surface and Interface Analysis
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