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Journal of Surface Analysis
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べき乗則で解釈されるスペクトルの閾値及びべき乗数の自動解析方法
Estimation of Inelastic Mean Free Paths in Au and Cu from Their Elastic Peak Intensity...
表面電子分光法における信号の減衰はいかに記述されるか? II. 誘電関数とIMFP
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysi...
InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告(I)
High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Hol...
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle In...
Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence ...
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Auger Depth Profiling Analysis
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Ultra Low Angle Incidence Ion Beam
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Ogiwara, Toshiya
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Tanuma, Shigeo
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Yoshikawa, Hideki
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Nagata, Takahiro
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