Composition determination of beta-(AlxGa1-x)2O3 layers coherently grown on (010) beta-Ga2O3 substrates by high-resolution x-ray diffraction

論文

著者

Yuichi Oshima ; Elaheh Ahmadi ; Stefan C. Badescu ; Feng Wu ; James S. Speck

キーワード

β-Ga2O3, composition, atom probe

刊行年月日

2016-06-01

更新時刻

2024-01-24 09:26:50 +0900