2 件のレコードが見つかりました。
Oxygen Defects and Instability in Very Thin a‐IGZO TFTs
- ジャーナル論文
- 著者
-
Hanjun Cho (author) (この著者で検索)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
;
Masatake Tsuji (author) (この著者で検索)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
;
Shigenori Ueda (author) (この著者で検索)
;
Junghwan Kim (author) (この著者で検索)
https://orcid.org/0000-0001-9168-6260
(unauthenticated)
;
Hideo Hosono (author) (この著者で検索)
- キーワード
- a-IGZO, TFT, Oxygen defects, positive-bias-stress instability
- 刊行年月日
- 2025-07-07
- 更新時刻
- 2025-09-24 12:30:21 +0900
Approach to Low Contact Resistance Formation on Buried Interface in Oxide Thin-Film Transistors: Utilization of Palladium-Mediated Hydrogen Pathway
- ジャーナル論文
- 著者
-
Yuhao Shi (author) (この著者で検索)
https://orcid.org/0000-0002-7956-193X
(unauthenticated)
;
Masatake Tsuji (author) (この著者で検索)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
;
Hanjun Cho (author) (この著者で検索)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
;
Shigenori Ueda (author) (この著者で検索)National Institute for Materials Science
;
Junghwan Kim (author) (この著者で検索)
https://orcid.org/0000-0001-9168-6260
(unauthenticated)
;
Hideo Hosono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- oxide semiconductors, IGZO, thin-film transistors, contact resistance, palladium, hydrogen
- 刊行年月日
- 2024-04-02
- 更新時刻
- 2024-04-08 16:30:22 +0900