6 件のレコードが見つかりました。
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
- ジャーナル論文
- 著者
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;Simon Moore (author) (この著者で検索)Mari Takahashi (author) (この著者で検索)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
;
Philipp Sauerschnig (author) (この著者で検索)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
;
;Keiji Kobayashi (author) (この著者で検索);Koichi Higashimine (author) (この著者で検索);Masanobu Miyata (author) (この著者で検索);Takahiro Baba (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)
;
Michihiro Ohta (author) (この著者で検索)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
;
Takao Mori (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Shinya Maenosono (author) (この著者で検索)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
- キーワード
- thermoelectric materials, electron microscopy, atom probe tomography
- 刊行年月日
- 2024-09-09
- 更新時刻
- 2025-08-26 08:30:23 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy, automation
- 刊行年月日
- 2023-02-19
- 更新時刻
- 2025-02-23 22:51:16 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
- ジャーナル論文
- 著者
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;Emi Kano (author) (この著者で検索);Keita Kataoka (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Kenta Chokawa (author) (この著者で検索);Hideki Sakurai (author) (この著者で検索);Akira Uedono (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索);Ritsuo Otsuki (author) (この著者で検索);Koki Kobayashi (author) (この著者で検索);Yuta Itoh (author) (この著者で検索);Masahiro Nagao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
;Jun Suda (author) (この著者で検索);Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
- キーワード
- gallium nitride, transmission electron microscopy, atom probe tomography
- 刊行年月日
- 2022-08-14
- 更新時刻
- 2024-01-05 22:13:58 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
- ジャーナル論文
- 著者
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;Yohei Nomura (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Tatsuya Tomita (author) (この著者で検索);Toru Takahashi (author) (この著者で検索);Hidenori Kuwata (author) (この著者で検索)Taichi Abe (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography
- 刊行年月日
- 2020-11-06
- 更新時刻
- 2024-04-05 10:56:21 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Kazuhiro Hono (author) (この著者で検索)
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy
- 刊行年月日
- 2025-02-03
- 更新時刻
- 2024-09-05 08:30:18 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
- ジャーナル論文
- 著者
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;Hirokazu Sasaki (author) (この著者で検索);Syunta Akiya (author) (この著者で検索);Kuniteru Mihara (author) (この著者で検索);Yojiro Oba (author) (この著者で検索);Masato Onuma (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
- キーワード
- atom probe tomography
- 刊行年月日
- 2025-01-01
- 更新時刻
- 2025-01-08 16:31:18 +0900