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論文・データセット
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資源タイプ
ジャーナル論文(5)
キーワード
atom probe tomography (5)
electron microscopy (1)
gallium nitride (1)
positron annihilation (1)
thermoelectric materials (1)
transmission electron microscopy (1)
(more)
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (2)
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application/pdf (5)
資源タイプ: ジャーナル論文
キーワード: atom probe tomography
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5 件のレコードが見つかりました。
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe
2
Nanosheets
ジャーナル論文
著者
Simon Moore
(author) (
この著者で検索
)
Simon Moore
;
Mari Takahashi
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9252-0721
(unauthenticated)
Mari Takahashi
;
Philipp Sauerschnig
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4666-5262
(unauthenticated)
Philipp Sauerschnig
;
Keiji Kobayashi
(author) (
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)
Keiji Kobayashi
;
Koichi Higashimine
(author) (
この著者で検索
)
Koichi Higashimine
;
Masanobu Miyata
(author) (
この著者で検索
)
Masanobu Miyata
;
Takahiro Baba
(author) (
この著者で検索
)
Takahiro Baba
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Michihiro Ohta
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9093-7117
(unauthenticated)
Michihiro Ohta
;
Takao Mori
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2682-1846
NIMS Researchers Directory SAMURAI
Takao Mori
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shinya Maenosono
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2669-8219
(unauthenticated)
Shinya Maenosono
キーワード
thermoelectric materials
,
electron microscopy
,
atom probe tomography
刊行年月日
2024-09-09
更新時刻
2025-08-26 08:30:23 +0900
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
ジャーナル論文
著者
Hirokazu Sasaki
(author) (
この著者で検索
)
Hirokazu Sasaki
;
Syunta Akiya
(author) (
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)
Syunta Akiya
;
Kuniteru Mihara
(author) (
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)
Kuniteru Mihara
;
Yojiro Oba
(author) (
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)
Yojiro Oba
;
Masato Onuma
(author) (
この著者で検索
)
Masato Onuma
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
キーワード
atom probe tomography
刊行年月日
2025-01-01
更新時刻
2025-01-08 16:31:18 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
ジャーナル論文
著者
Emi Kano
(author) (
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)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
Emi Kano
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Koki Kobayashi
(author) (
この著者で検索
)
Koki Kobayashi
;
Kosuke Ishikawa
(author) (
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)
Kosuke Ishikawa
;
Kyosuke Sawabe
(author) (
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)
Kyosuke Sawabe
;
Tetsuo Narita
(author) (
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)
Tetsuo Narita
;
Kacper Sierakowski
(author) (
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)
Kacper Sierakowski
;
Michal Bockowski
(author) (
この著者で検索
)
Michal Bockowski
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Tetsu Kachi
(author) (
この著者で検索
)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
Nobuyuki Ikarashi
キーワード
gallium nitride
,
atom probe tomography
,
transmission electron microscopy
刊行年月日
2024-04-22
更新時刻
2024-09-20 16:30:27 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
ジャーナル論文
著者
Yohei Nomura
(author) (
この著者で検索
)
Yohei Nomura
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tatsuya Tomita
(author) (
この著者で検索
)
Tatsuya Tomita
;
Toru Takahashi
(author) (
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)
Toru Takahashi
;
Hidenori Kuwata
(author) (
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)
Hidenori Kuwata
;
Taichi Abe
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5065-0939
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Taichi Abe
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Kazuhiro Hono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
キーワード
atom probe tomography
刊行年月日
2020-11-06
更新時刻
2024-04-05 10:56:21 +0900
Vacancy-Type Defects and Oxygen Incorporation in NiAl for Advanced Interconnects Probed by Monoenergetic Positron Beams and Atom Probe Tomography
ジャーナル論文
著者
Akira Uedono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Claudia Fleischmann
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1531-6916
(unauthenticated)
Claudia Fleischmann
;
Jean-Philippe Soulié
(author) (
この著者で検索
)
Jean-Philippe Soulié
;
Mustafa Ayyad
(author) (
この著者で検索
)
Mustafa Ayyad
;
Jeroen E. Scheerder
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9301-0392
(unauthenticated)
Jeroen E. Scheerder
;
Christoph Adelmann
(author) (
この著者で検索
)
Christoph Adelmann
;
Jun Uzuhashi
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Koji Michishio
(author) (
この著者で検索
)
https://orcid.org/0000-0003-1381-7856
(unauthenticated)
Koji Michishio
;
Nagayasu Oshima
(author) (
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)
Nagayasu Oshima
;
Shoji Ishibashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
キーワード
atom probe tomography
,
positron annihilation
刊行年月日
2024-07-10
更新時刻
2025-07-10 08:30:19 +0900
キーワード
atom probe tomography
(5)
electron microscopy
(1)
gallium nitride
(1)
positron annihilation
(1)
thermoelectric materials
(1)
transmission electron microscopy
(1)
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