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22 件のレコードが見つかりました。 1件目から10件目まで表示します。

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DataSummary_Extrusion_Manuscript_20210728.xlsx
Process parameters and magnetic properties (coercivity, remanence, squareness, maximum energy product) of data-driven fabrication of Nd-Fe-B anisotropic magnets by direct hot extrusion.
データセット
著者
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
キーワード
Maximum energy product, Coercivity, Squareness, Machine learning, Remanence, Process, Bayesian Optimization, Hot extrusion, Active learning, Nd-Fe-B magnet
刊行年月日
2021-10-11
更新時刻
2022-10-03 02:01:08 +0900
データセット
International XAFS DB RDF and Ontology
データセット
著者
Masashi Ishii (author) (この著者で検索)
NIMS Center for Basic Research on Materials
ORCID SAMURAI ; ORCID SAMURAI ;
Koichi Sakamoto (author) (この著者で検索)
NIMS Center for Basic Research on Materials
;
Shohei Yamashita (author) (この著者で検索)
KEK Institute of Materials Structure Science
;
Yasuhiro Niwa (author) (この著者で検索)
KEK Institute of Materials Structure Science
ORCID ;
Yasuhiro Inada (author) (この著者で検索)
Ritsumeikan University College of Life Sciences
ORCID
キーワード
International XAFS DB portal, Cross-database search, Terminology, Ontology, Semantics, RDF
刊行年月日
2025-05-01
更新時刻
2025-07-01 12:30:26 +0900
GaN_O2.jpg
Continuous real-time O 1s core XPS spectra of initial O2 molecule adsorption on polar and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
GaN, Gallium nitride, Oxidation, Adsorption, XPS, SPring-8
刊行年月日
2020-11-19
更新時刻
2024-01-05 22:13:22 +0900
GaN_H2O.jpg
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
刊行年月日
2022-12-31
更新時刻
2024-01-05 22:11:14 +0900
Keyun Gu IEEE-NEMS 20231214-check Liao-R.docx
Ultrahigh Responsivity of Diamond-based Solar-blind Photodetectors Using Hydrogen Plasma Treatment
データセット
著者
Keyun Gu (author) (この著者で検索)
;
Zilong Zhang (author) (この著者で検索)
;
Guo Chen (author) (この著者で検索)
;
Liwen Sang (author) (この著者で検索)
;
Jian Huang (author) (この著者で検索)
;
Yasuo Koide (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Meiyong Liao (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Diamond, photodetector
刊行年月日
2024-05-02
更新時刻
2024-10-11 14:30:31 +0900
Dataset
Calculated crystal structures of formamidinium–lead–chloride–dimethyl sulfoxide and related compounds
データセット
著者
Noriko Saito (author) (この著者で検索)
Research Center for Functional Materials/Electric and Electronic Materials Field/Ceramics Surface and Interface Group
ORCID SAMURAI ;
Yoshitaka Matsushita (author) (この著者で検索)
Research Network and Facility Services Division/Materials Analysis Station
ORCID SAMURAI ;
Takeo Ohsawa (author) (この著者で検索)
Research Center for Functional Materials/Electric and Electronic Materials Field/Electroceramics Group
ORCID SAMURAI ;
Hiroyo Segawa (author) (この著者で検索)
Research Center for Functional Materials/Electric and Electronic Materials Field/Electroceramics Group
ORCID SAMURAI ;
Naoki Ohashi (author) (この著者で検索)
Research Center for Functional Materials/Electric and Electronic Materials Field/Electroceramics Group
ORCID SAMURAI
キーワード
hybrid halide, formamidinium, dimethyl sulfoxide (DMSO), lead halide
刊行年月日
2022-11-03
更新時刻
2024-01-05 22:13:14 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
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