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論文・データセット
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ジャーナル論文(3)
キーワード
IGZO (1)
Oxygen defects (1)
TFT (1)
a-IGZO (1)
contact resistance (1)
dielectrics (1)
hydrogen (1)
oxide semiconductors (1)
palladium (1)
positive-bias-stress instability (1)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (2)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
ファイル種別
application/pdf (3)
3 件のレコードが見つかりました。
Oxygen Defects and Instability in Very Thin a‐IGZO TFTs
ジャーナル論文
著者
Hanjun Cho
(author) (
この著者で検索
)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
Hanjun Cho
;
Masatake Tsuji
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Shigenori Ueda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Junghwan Kim
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9168-6260
(unauthenticated)
Junghwan Kim
;
Hideo Hosono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9260-6728
NIMS Researchers Directory SAMURAI
Hideo Hosono
キーワード
a-IGZO
,
TFT
,
Oxygen defects
,
positive-bias-stress instability
刊行年月日
2025-07-07
更新時刻
2025-09-24 12:30:21 +0900
Theoretical and data-driven approaches to semiconductors and dielectrics: from prediction to experiment
ジャーナル論文
著者
Fumiyasu Oba
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7178-5333
(unauthenticated)
Fumiyasu Oba
;
Takayuki Nagai
(author) (
この著者で検索
)
https://orcid.org/0009-0001-3284-3737
(unauthenticated)
Takayuki Nagai
;
Ryoji Katsube
(author) (
この著者で検索
)
https://orcid.org/0000-0003-4962-8547
(unauthenticated)
Ryoji Katsube
;
Yasuhide Mochizuki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8292-7736
(unauthenticated)
Yasuhide Mochizuki
;
Masatake Tsuji
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Guillaume Deffrennes
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3752-2537
(unauthenticated)
Guillaume Deffrennes
;
Kota Hanzawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-0995-9360
(unauthenticated)
Kota Hanzawa
;
Akitoshi Nakano
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9780-5179
(unauthenticated)
Akitoshi Nakano
;
Akira Takahashi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3159-9007
(unauthenticated)
Akira Takahashi
;
Kei Terayama
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3914-248X
(unauthenticated)
Kei Terayama
;
Ryo Tamura
(author) (
この著者で検索
)
https://orcid.org/0000-0002-0349-358X
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Tamura
;
Hidenori Hiramatsu
(author) (
この著者で検索
)
https://orcid.org/0000-0002-5664-5831
(unauthenticated)
Hidenori Hiramatsu
;
Yoshitaro Nose
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8320-1953
(unauthenticated)
Yoshitaro Nose
;
Hiroki Taniguchi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-1773-7856
(unauthenticated)
Hiroki Taniguchi
キーワード
semiconductors
,
dielectrics
刊行年月日
2024-12-31
更新時刻
2024-12-25 16:31:05 +0900
Approach to Low Contact Resistance Formation on Buried Interface in Oxide Thin-Film Transistors: Utilization of Palladium-Mediated Hydrogen Pathway
ジャーナル論文
著者
Yuhao Shi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7956-193X
(unauthenticated)
Yuhao Shi
;
Masatake Tsuji
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
Masatake Tsuji
;
Hanjun Cho
(author) (
この著者で検索
)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
Hanjun Cho
;
Shigenori Ueda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9425-0614
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Junghwan Kim
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9168-6260
(unauthenticated)
Junghwan Kim
;
Hideo Hosono
(author) (
この著者で検索
)
https://orcid.org/0000-0001-9260-6728
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideo Hosono
キーワード
oxide semiconductors
,
IGZO
,
thin-film transistors
,
contact resistance
,
palladium
,
hydrogen
刊行年月日
2024-04-02
更新時刻
2024-04-08 16:30:22 +0900
キーワード
IGZO
(1)
Oxygen defects
(1)
TFT
(1)
a-IGZO
(1)
contact resistance
(1)
dielectrics
(1)
hydrogen
(1)
oxide semiconductors
(1)
palladium
(1)
positive-bias-stress instability
(1)
semiconductors
(1)
thin-film transistors
(1)
RDEメタデータ定義
RDE送り状
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