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Article and Dataset
Collection
Resource type
Journal article(18)
Conference presentation(2)
Dataset(1)
Keyword
IMFP (5)
X-ray photoelectron spectroscopy (5)
Bayesian estimation (4)
full Penn algorithm (3)
liquid water (3)
Electron Inelastic Mean Free Path (2)
Exchange Monte Carlo method (2)
FPA (2)
SESSA (2)
TPP-2M (2)
(more)
License
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International (7)
Creative Commons BY Attribution 4.0 International (5)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (4)
In Copyright (1)
File type
application/pdf (19)
application/vnd.openxmlformats-officedocument.wordprocessingml.document (3)
application/octet-stream (1)
21 records found.
How is the Signal Attenuation in Surface Electron Spectroscopy Described?
Journal article
Creator
Shigeo Tanuma
(author) (
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)
Shigeo Tanuma
;
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
Keyword
表面電子分光
,
非弾性平均自由行程
,
簡易単極近似
,
Full Penn algorithm
,
誘電関数
Date published
2026-04-26
Updated at
2026-05-22 13:47:19 +0900
A data-driven surrogate model for X-ray photoelectron spectroscopy based on survey spectrum background features
Journal article
Creator
Shunichi Yoneda
(author) (
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)
Shunichi Yoneda
;
Ryo Murakami
(author) (
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)
https://orcid.org/0000-0001-8585-9268
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Murakami
;
Hiroshi Shinotsuka
(author) (
Search by this author
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
Search by this author
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
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)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
;
Hiromi Tanaka
(author) (
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)
Hiromi Tanaka
;
Hayaru Shouno
(author) (
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)
Hayaru Shouno
;
Kenji Nagata
(author) (
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)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
Keyword
X-ray photoelectron spectroscopy
,
Survey spectrum
,
Surrogate model
,
Total electron attenuation length
,
Thickness estimation
Date published
2026-03-31
Updated at
2026-04-16 15:42:06 +0900
First-principles Calculations of Optical Energy Loss Functions for 30 Compound and 5 Elemental Semiconductors
Journal article
Creator
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
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)
https://orcid.org/0000-0003-2628-9941
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
Keyword
Energy loss function
,
Optical constant
,
First-principles calculation
,
Compound semiconductor
,
Inelastic mean free paths
Date published
2021-07-15
Updated at
2026-02-04 12:30:04 +0900
Hard x-ray photoelectron spectroscopy (HAXPES) Cr
Kα
and XPS Al
K
α
measurements of bulk lithium metal
Journal article
Creator
Hideyuki Yasufuku
(author) (
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)
https://orcid.org/0000-0001-5600-8958
NIMS Researchers Directory SAMURAI
Hideyuki Yasufuku
;
Tsuyoshi Ohnishi
(author) (
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)
https://orcid.org/0000-0002-2333-7752
NIMS Researchers Directory SAMURAI
Tsuyoshi Ohnishi
;
Shigenori Ueda
(author) (
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)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Yoshiyuki Yamashita
(author) (
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)
https://orcid.org/0000-0003-0994-8095
NIMS Researchers Directory SAMURAI
Yoshiyuki Yamashita
;
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shigeo Tanuma
(author) (
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)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Shigeo Tanuma
;
Satoshi Kawada
(author) (
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)
https://orcid.org/0000-0003-4618-2746
NIMS Researchers Directory SAMURAI
Satoshi Kawada
;
Yoshitaka Matsushita
(author) (
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)
https://orcid.org/0000-0002-4968-8905
NIMS Researchers Directory SAMURAI
Yoshitaka Matsushita
Keyword
Lithium
,
HAPES
,
Cr Kα
,
Al Kα
Date published
2026-06-01
Updated at
2026-01-28 12:30:04 +0900
Bayesian inference for peak feature extraction and prediction of material property in X-ray diffraction data
Journal article
Creator
Ryo Murakami
(author) (
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)
https://orcid.org/0000-0001-8585-9268
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Murakami
;
Taisuke T. Sasaki
(author) (
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)
https://orcid.org/0000-0002-5952-7638
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Taisuke T. Sasaki
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Yoshitaka Matsushita
(author) (
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)
https://orcid.org/0000-0002-4968-8905
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Yoshitaka Matsushita
;
Keitaro Sodeyama
(author) (
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)
https://orcid.org/0000-0002-9228-0729
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Keitaro Sodeyama
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Kenji Nagata
(author) (
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)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
Keyword
Materials informatics
,
Spectral decomposition
,
Bayesian estimation
,
Feature selection
,
AI-ready
Date published
2024-12-31
Updated at
2025-11-10 16:30:53 +0900
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
Journal article
Creator
Atsushi Machida
(author) (
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)
Atsushi Machida
;
Kenji Nagata
(author) (
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)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Ryo Murakami
(author) (
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)
https://orcid.org/0000-0001-8585-9268
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Ryo Murakami
;
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Hayaru Shouno
(author) (
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)
Hayaru Shouno
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Masato Okada
(author) (
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)
Masato Okada
Keyword
X-ray photoelectron spectroscopy
,
Bayesian estimation
,
Exchange Monte Carlo method
,
SESSA
Date published
2024-05-29
Updated at
2025-11-10 12:30:27 +0900
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
Journal article
Creator
Hiroshi Shinotsuka
(author) (
Search by this author
)
https://orcid.org/0000-0001-5147-1396
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Kenji Nagata
(author) (
Search by this author
)
https://orcid.org/0000-0001-9894-4461
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Hideki Yoshikawa
(author) (
Search by this author
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Shuichi Ogawa
(author) (
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)
Shuichi Ogawa
;
Akitaka Yoshigoe
(author) (
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)
Akitaka Yoshigoe
Keyword
Bayesian estimation
,
X-ray photoelectron spectroscopy
,
Statistical analysis
,
Silicon surface oxidation
Date published
2024-12-03
Updated at
2025-01-21 12:30:34 +0900
表面電子分光法における信号の減衰は如何に記述されるか? VI. 元素における双極子行列要素平方の計算とPenn algorithmによるIMFPの計算
Journal article
Creator
田沼繁夫
(author) (
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)
https://orcid.org/0000-0003-2628-9941
技術開発・共用部門, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
田沼繁夫
;
篠塚寛志
(author) (
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)
https://orcid.org/0000-0001-5147-1396
技術開発・共用部門, 物質・材料研究機構
NIMS Researchers Directory SAMURAI
篠塚寛志
Keyword
双極子行列要素平方
,
非弾性平均自由行程
,
IMFP
,
Penn algorithm
,
Modified Bethe equation
Date published
2024-06-12
Updated at
2024-06-17 12:30:17 +0900
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
Journal article
Creator
Hiroshi Shinotsuka
(author) (
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)
https://orcid.org/0000-0001-5147-1396
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hiroshi Shinotsuka
;
Kenji Nagata
(author) (
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)
https://orcid.org/0000-0001-9894-4461
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Nagata
;
Malinda Siriwardana
(author) (
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)
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
Malinda Siriwardana
;
Hideki Yoshikawa
(author) (
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)
https://orcid.org/0000-0002-7389-8865
Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Hayaru Shouno
(author) (
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)
https://orcid.org/0000-0002-2412-0184
(unauthenticated)
Graduate School of Informatics and Engineering, The University of Electro-Communications
Hayaru Shouno
;
Masato Okada
(author) (
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)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
Graduate School of Frontier Science, The University of Tokyo
Masato Okada
Keyword
X-ray photoelectron spectroscopy
,
Bayesian estimation
,
Exchange Monte Carlo method
,
SESSA
Date published
2023-07-06
Updated at
2024-01-05 22:11:57 +0900
Electron Inelastic Mean Free Paths in Liquid Water for Energies from10 eV to 10 keV
Conference presentation
Creator
TANUMA, Shigeo
(author) (
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)
https://orcid.org/0000-0003-2628-9941
表面化学分析グループ, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
TANUMA, Shigeo
;
SHINOTSUKA, Hiroshi
(author) (
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)
https://orcid.org/0000-0001-5147-1396
ナノ計測センター/先端表面化学分析グループ, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
SHINOTSUKA, Hiroshi
;
DA, Bo
(author) (
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)
https://orcid.org/0000-0002-0785-8662
表面化学分析グループ, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
DA, Bo
;
YOSHIKAWA, Hideki
(author) (
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)
https://orcid.org/0000-0002-7389-8865
表面化学分析グループ, National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
;
パウエル
(author) (
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)
NIST
パウエル
Keyword
IMFP
,
liquid water
Date published
Updated at
2023-06-29 11:55:58 +0900
Keyword
IMFP
(5)
X-ray photoelectron spectroscopy
(5)
Bayesian estimation
(4)
full Penn algorithm
(3)
liquid water
(3)
Electron Inelastic Mean Free Path
(2)
Exchange Monte Carlo method
(2)
FPA
(2)
SESSA
(2)
TPP-2M
(2)
electron inelastic mean free path
(2)
energy loss function
(2)
optical constant
(2)
relativistic TPP-2M
(2)
relativistic full Penn algorithm
(2)
非弾性平均自由行程
(2)
10 ~ predictive equation for IMFP
(1)
11 ~ elemental solid
(1)
12 ~ relativistic Bethe equation
(1)
13 ~ Fano plot
(1)
14 ~ IMFP
(1)
41 elemental solids
(1)
AI-ready
(1)
Active Shirley method
(1)
Akaike information criterion (AIC)
(1)
Al Kα
(1)
Automatic spectrum analysis
(1)
Bayesian information criterion
(1)
Bayesian information criterion (BIC)
(1)
Bethe equation
(1)
Compound semiconductor
(1)
Cr Kα
(1)
EAL
(1)
ELF
(1)
Electron Stopping Power
(1)
Electron stopping power
(1)
Energy loss function
(1)
Feature selection
(1)
First-principles calculation
(1)
Full Penn algorithm
(1)
HAPES
(1)
Inelastic mean free paths
(1)
Influence of electron exchange
(1)
Lithium
(1)
MED
(1)
Materials informatics
(1)
Mermin model
(1)
Modified Bethe equation
(1)
Multiple core level spectra
(1)
Optical constant
(1)
Penn algorithm
(1)
Silicon surface oxidation
(1)
Spectral decomposition
(1)
Statistical analysis
(1)
Surrogate model
(1)
Survey spectrum
(1)
Thickness estimation
(1)
Total electron attenuation length
(1)
X-ray photoelectron spectroscopy (XPS)
(1)
asymmetry parameter
(1)
bandgap correction
(1)
compound semiconductor
(1)
effective attenuation length
(1)
electron inelastic mean free paths
(1)
energy-loss functions
(1)
first-principles calculation
(1)
high-energy photoelectron spectroscopy
(1)
inelastic mean free paths
(1)
lnearly polarized X-rays
(1)
mean escape depth
(1)
organic compounds
(1)
plasmon lifetime
(1)
static structure factor
(1)
双極子行列要素平方
(1)
簡易単極近似
(1)
表面電子分光
(1)
誘電関数
(1)
RDE metadata def
RDE invoice schema
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