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Journal article(5)
Conference paper(1)
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gallium nitride (6)
atom probe tomography (2)
FNO (1)
GaN (1)
HAXPES (1)
cathodoluminescence (1)
defect passivation (1)
fluorination (1)
implantation (1)
nitrosyl fluoride (1)
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In Copyright (4)
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Keyword: gallium nitride
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Vacancy‐Type Defects and Their Trapping/Detrapping of Charge Carriers in Ion‐Implanted GaN Studied by Positron Annihilation
Journal article
Creator
Akira Uedono
(author) (
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https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Ryo Tanaka
(author) (
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)
https://orcid.org/0000-0002-4058-7649
(unauthenticated)
Ryo Tanaka
;
Shinya Takashima
(author) (
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)
https://orcid.org/0000-0002-3212-4521
(unauthenticated)
Shinya Takashima
;
Katsunori Ueno
(author) (
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)
Katsunori Ueno
;
Masaharu Edo
(author) (
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)
Masaharu Edo
;
Kohei Shima
(author) (
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)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
Kohei Shima
;
Shigefusa F. Chichibu
(author) (
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)
https://orcid.org/0000-0001-9558-1642
(unauthenticated)
Shigefusa F. Chichibu
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shoji Ishibashi
(author) (
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)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
;
Kacper Sierakowski
(author) (
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)
https://orcid.org/0000-0002-9447-1182
(unauthenticated)
Kacper Sierakowski
;
Michal Bockowski
(author) (
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)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
Michal Bockowski
Keyword
gallium nitride
Date published
2024-02-29
Updated at
2025-03-01 12:30:45 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
Journal article
Creator
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Jun Chen
(author) (
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)
https://orcid.org/0000-0003-4272-2653
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Chen
;
Ashutosh Kumar
(author) (
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https://orcid.org/0000-0002-8085-1598
(unauthenticated)
National Institute for Materials Science
Ashutosh Kumar
;
Wei Yi
(author) (
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)
https://orcid.org/0000-0001-5040-8416
(unauthenticated)
National Institute for Materials Science
Wei Yi
;
Tadakatsu Ohkubo
(author) (
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https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Ryo Tanaka
(author) (
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Ryo Tanaka
;
Shinya Takashima
(author) (
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)
Shinya Takashima
;
Masaharu Edo
(author) (
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)
Masaharu Edo
;
Kacper Sierakowski
(author) (
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)
Kacper Sierakowski
;
Michal Bockowski
(author) (
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Michal Bockowski
;
Hideki Sakurai
(author) (
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Hideki Sakurai
;
Tetsu Kachi
(author) (
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Tetsu Kachi
;
Takashi Sekiguchi
(author) (
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https://orcid.org/0000-0002-7365-9979
(unauthenticated)
National Institute for Materials Science
Takashi Sekiguchi
;
Kazuhiro Hono
(author) (
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)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
Keyword
gallium nitride
,
implantation
,
atom probe tomography
,
cathodoluminescence
,
scanning transmission electron microscopy
Date published
2022-05-14
Updated at
2024-01-05 22:11:22 +0900
Annealing properties of vacancy-type defects in ion implanted GaN during ultra-high-pressure annealing studied by using a monoenergetic positron beam
Journal article
Creator
Akira Uedono
(author) (
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)
Akira Uedono
;
Hideki Sakurai
(author) (
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)
Hideki Sakurai
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tetsuo Narita
(author) (
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Tetsuo Narita
;
Kacper Sierakowski
(author) (
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)
Kacper Sierakowski
;
Shoji Ishibashi
(author) (
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)
Shoji Ishibashi
;
Shigefusa F. Chichibu
(author) (
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)
Shigefusa F. Chichibu
;
Michal Bockowski
(author) (
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)
Michal Bockowski
;
Jun Suda
(author) (
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)
Jun Suda
;
Tadakatsu Ohokubo
(author) (
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)
Tadakatsu Ohokubo
;
Nobuyuki Ikarashi
(author) (
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)
Nobuyuki Ikarashi
;
Kazuhiro Hono
(author) (
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)
https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
;
Tetsu Kachi
(author) (
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)
Tetsu Kachi
Keyword
gallium nitride
,
vacancy
,
positron
Date published
2023-03-15
Updated at
2024-01-05 22:12:35 +0900
Characterization of Vacancy-Type Defects in Mg- and N-Implanted GaN by using a Monoenergetic Positron Beam
Conference paper
Creator
Akira Uedono
(author) (
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)
Akira Uedono
;
Ryo Tanaka
(author) (
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)
Ryo Tanaka
;
Shinya Takashima
(author) (
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)
Shinya Takashima
;
Katsunori Ueno
(author) (
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)
Katsunori Ueno
;
Masaharu Edo
(author) (
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)
Masaharu Edo
;
Kohei Shima
(author) (
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)
Kohei Shima
;
Shigefusa F. Chichibu
(author) (
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)
Shigefusa F. Chichibu
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
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)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shoji Ishibashi
(author) (
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)
Shoji Ishibashi
;
Kacper Sierakowski
(author) (
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)
Kacper Sierakowski
;
Michal Bockowski
(author) (
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)
Michal Bockowski
Keyword
gallium nitride
Date published
2025-06-04
Updated at
2025-09-17 16:30:20 +0900
Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface
Journal article
Creator
Takahiro Nagata
(author) (
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https://orcid.org/0000-0002-8591-2943
NIMS Researchers Directory SAMURAI
Takahiro Nagata
;
Asahiko Matsuda
(author) (
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)
https://orcid.org/0000-0001-5989-027X
NIMS Researchers Directory SAMURAI
Asahiko Matsuda
;
Takashi Teramoto
(author) (
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https://orcid.org/0000-0002-9368-1284
(unauthenticated)
Takashi Teramoto
;
Dominic Gerlach
(author) (
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https://orcid.org/0000-0003-1859-0750
(unauthenticated)
Dominic Gerlach
;
Peng Shen
(author) (
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https://orcid.org/0000-0002-1971-5490
(unauthenticated)
Peng Shen
;
Shigenori Ueda
(author) (
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)
https://orcid.org/0000-0001-9425-0614
NIMS Researchers Directory SAMURAI
Shigenori Ueda
;
Takako Kimura
(author) (
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https://orcid.org/0009-0007-0109-4482
(unauthenticated)
Takako Kimura
;
Christian Dussarrat
(author) (
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https://orcid.org/0009-0000-1063-6473
(unauthenticated)
Christian Dussarrat
;
Toyohiro Chikyow
(author) (
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)
https://orcid.org/0000-0003-3860-4806
NIMS Researchers Directory SAMURAI
Toyohiro Chikyow
Keyword
gallium nitride
,
GaN
,
nitrosyl fluoride
,
FNO
,
HAXPES
,
defect passivation
,
fluorination
Date published
2025-03-07
Updated at
2025-03-26 17:26:31 +0900
Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN
Journal article
Creator
Kosuke Ishikawa
(author) (
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Kosuke Ishikawa
;
Emi Kano
(author) (
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)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
Emi Kano
;
Jun Uzuhashi
(author) (
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)
https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Kensuke Sumida
(author) (
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)
Kensuke Sumida
;
Tetsuo Narita
(author) (
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https://orcid.org/0000-0002-0849-360X
(unauthenticated)
Tetsuo Narita
;
Masahiro Horita
(author) (
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https://orcid.org/0000-0003-0008-6732
(unauthenticated)
Masahiro Horita
;
Junya Sahashi
(author) (
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Junya Sahashi
;
Shun Lu
(author) (
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https://orcid.org/0000-0002-7342-757X
(unauthenticated)
Shun Lu
;
Jun Suda
(author) (
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https://orcid.org/0000-0002-5453-4943
(unauthenticated)
Jun Suda
;
Tadakatsu Ohkubo
(author) (
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https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Tetsu Kachi
(author) (
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)
https://orcid.org/0000-0002-4300-5720
(unauthenticated)
Tetsu Kachi
;
Nobuyuki Ikarashi
(author) (
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https://orcid.org/0000-0002-5575-5780
(unauthenticated)
Nobuyuki Ikarashi
Keyword
gallium nitride
,
atom probe tomography
Date published
2026-06-22
Updated at
2026-06-25 09:46:49 +0900
Keyword
gallium nitride
(6)
atom probe tomography
(2)
FNO
(1)
GaN
(1)
HAXPES
(1)
cathodoluminescence
(1)
defect passivation
(1)
fluorination
(1)
implantation
(1)
nitrosyl fluoride
(1)
positron
(1)
scanning transmission electron microscopy
(1)
vacancy
(1)
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Collection
Resource type
Journal article(5)
Conference paper(1)
Keyword
gallium nitride (6)
atom probe tomography (2)
FNO (1)
GaN (1)
HAXPES (1)
cathodoluminescence (1)
defect passivation (1)
fluorination (1)
implantation (1)
nitrosyl fluoride (1)
(more)
License
In Copyright (4)
Creative Commons BY Attribution 4.0 International (1)
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