Keyword: atom probe tomography
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6 records found.

Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesised SnSe2 Nanosheets.pdf
Mechanistic Insight into the Effect of Cu Doping on Thermoelectric Properties of Sintered Wet-Chemically Synthesized SnSe2 Nanosheets
Journal article
Creator
Simon Moore (author) (Search by this author)
;
Mari Takahashi (author) (Search by this author)
ORCID ;
Philipp Sauerschnig (author) (Search by this author)
ORCID ;
Keiji Kobayashi (author) (Search by this author)
;
Koichi Higashimine (author) (Search by this author)
;
Masanobu Miyata (author) (Search by this author)
;
Takahiro Baba (author) (Search by this author)
; ORCID SAMURAI ;
Michihiro Ohta (author) (Search by this author)
ORCID ; ORCID SAMURAI ; ORCID SAMURAI ;
Shinya Maenosono (author) (Search by this author)
ORCID
Keyword
thermoelectric materials, electron microscopy, atom probe tomography
Date published
2024-09-09
Updated at
2025-08-26 08:30:23 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM.pdf
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
Journal article
Creator
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy, automation
Date published
2023-02-19
Updated at
2025-02-23 22:51:16 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation.pdf
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
Journal article
Creator
Emi Kano (author) (Search by this author)
;
Keita Kataoka (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kenta Chokawa (author) (Search by this author)
;
Hideki Sakurai (author) (Search by this author)
;
Akira Uedono (author) (Search by this author)
;
Tetsuo Narita (author) (Search by this author)
;
Kacper Sierakowski (author) (Search by this author)
;
Michal Bockowski (author) (Search by this author)
;
Ritsuo Otsuki (author) (Search by this author)
;
Koki Kobayashi (author) (Search by this author)
;
Yuta Itoh (author) (Search by this author)
;
Masahiro Nagao (author) (Search by this author)
;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Suda (author) (Search by this author)
;
Tetsu Kachi (author) (Search by this author)
;
Nobuyuki Ikarashi (author) (Search by this author)
Keyword
gallium nitride, transmission electron microscopy, atom probe tomography
Date published
2022-08-14
Updated at
2024-01-05 22:13:58 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials.pdf
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
Journal article
Creator
Yohei Nomura (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tatsuya Tomita (author) (Search by this author)
;
Toru Takahashi (author) (Search by this author)
;
Hidenori Kuwata (author) (Search by this author)
;
Taichi Abe (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography
Date published
2020-11-06
Updated at
2024-04-05 10:56:21 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
Journal article
Creator
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy
Date published
2025-02-03
Updated at
2024-09-05 08:30:18 +0900
66_MT-D2024005.pdf
Characterization of δNi<sub>2</sub>Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography
Journal article
Creator
Hirokazu Sasaki (author) (Search by this author)
;
Syunta Akiya (author) (Search by this author)
;
Kuniteru Mihara (author) (Search by this author)
;
Yojiro Oba (author) (Search by this author)
;
Masato Onuma (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI
Keyword
atom probe tomography
Date published
2025-01-01
Updated at
2025-01-08 16:31:18 +0900