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Article and Dataset
Collection
Resource type
Journal article(7)
Conference presentation(1)
Keyword
XPS (8)
AES (3)
IMFP (2)
TPP-2M (2)
in situ (2)
オペランド (2)
AFM (1)
Auger electron spectroscopy (1)
Band bending (1)
DFT (1)
(more)
License
In Copyright (5)
Creative Commons BY Attribution 4.0 International (1)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
File type
application/pdf (6)
application/vnd.openxmlformats-officedocument.wordprocessingml.document (2)
Keyword: XPS
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8 records found.
Crystallographic and Electronic Structures of Nb:YTaO
4
and Tb:YTaO
4
Single-Crystal Scintillators
Journal article
Creator
Yueshen Zhou
(author) (
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)
https://orcid.org/0009-0009-5327-9731
NIMS Researchers Directory SAMURAI
Yueshen Zhou
;
Encarnación G. Víllora
(author) (
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)
Encarnación G. Víllora
;
Ryoji Sahara
(author) (
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)
https://orcid.org/0000-0003-0788-2985
NIMS Researchers Directory SAMURAI
Ryoji Sahara
;
Arkapol Saengdeejing
(author) (
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)
https://orcid.org/0000-0001-8739-3262
NIMS Researchers Directory SAMURAI
Arkapol Saengdeejing
;
Kiyoshi Shimamura
(author) (
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)
https://orcid.org/0000-0001-6502-8731
NIMS Researchers Directory SAMURAI
Kiyoshi Shimamura
Keyword
Single-crystal structure analysis
,
DFT
,
Tb:YTaO4
,
XPS
,
Nb:YTaO4
Date published
2025-07-31
Updated at
2025-08-01 10:06:22 +0900
Determination of Inelastic Mean Free Paths in Elemental Solids in the 200 to 5000 eV Energy Range by Absolute Elastic Peak Electron Spectroscopy
Conference presentation
Creator
Tanuma,S
(author) (
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)
https://orcid.org/0000-0003-2628-9941
物質・材料研究機構
NIMS Researchers Directory SAMURAI
Tanuma,S
;
Okamoto, N
(author) (
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)
物質・材料研究機構
Okamoto, N
;
Azuma, Y
(author) (
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)
Azuma, Y
;
Kimura, T
(author) (
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)
物質・材料研究機構
Kimura, T
;
Goto, K
(author) (
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)
名古屋工業大学
Goto, K
Keyword
IMFP
,
TPP-2M
,
AES
,
XPS
Date published
2006-09-24
Updated at
2023-07-07 09:23:43 +0900
Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction
Journal article
Creator
J. W. Liu
(author) (
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)
https://orcid.org/0000-0003-2580-7401
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
J. W. Liu
;
T. Teraji
(author) (
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)
https://orcid.org/0000-0002-7731-0547
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
T. Teraji
;
B. Da
(author) (
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)
https://orcid.org/0000-0002-0785-8662
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
B. Da
;
Y. Koide
(author) (
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)
https://orcid.org/0000-0001-8321-9822
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Y. Koide
Keyword
binding energy calibration
,
carbon-related materials
,
XPS
,
diamond
,
Band bending
Date published
2024-09-02
Updated at
2024-09-13 12:30:32 +0900
Origin of two-dimensional MXene/ferromagnetic interface evaluated by angle-dependent hard X-ray photoemission spectroscopy
Journal article
Creator
Prabhat Kumar
(author) (
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)
https://orcid.org/0000-0003-3897-193X
(unauthenticated)
Prabhat Kumar
;
Shunsuke Tsuda
(author) (
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)
https://orcid.org/0000-0001-6209-8048
NIMS Researchers Directory SAMURAI
Shunsuke Tsuda
;
Koichiro Yaji
(author) (
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)
https://orcid.org/0000-0002-0721-1316
NIMS Researchers Directory SAMURAI
Koichiro Yaji
;
Shinji Isogami
(author) (
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)
https://orcid.org/0000-0001-7230-6090
NIMS Researchers Directory SAMURAI
Shinji Isogami
Keyword
MXene
,
Interface
,
XPS
Date published
2025-12-31
Updated at
2025-09-16 12:30:22 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
Journal article
Creator
Tanuma, Shigeo
(author) (
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)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Powell, C. J.
(author) (
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)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
Powell, C. J.
;
Penn, D. R.
(author) (
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)
Penn, D. R.
Keyword
IMFP
,
TPP-2M
,
number of valence electrons
,
elemental solids
,
XPS
,
electron inelastic mean free paths
,
surface sensitivity
,
IMFPs
,
AES
,
surface analysis
Date published
2003-02-11
Updated at
2022-10-03 01:54:38 +0900
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Journal article
Creator
TANUMA, Shigeo
(author) (
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)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
TANUMA, Shigeo
Keyword
XPS
,
quantitative surface analysis
,
X-ray photoelectron spectroscopy
,
Auger electron spectroscopy
,
relative sensitivity factor
,
ISO
,
International Organization for Standardization
,
AES
Date published
2005-12-28
Updated at
2024-01-05 22:11:34 +0900
実験室型 XPS 装置による溶液種の観察と全固体電池の実働環境計測
Journal article
Creator
遠藤 頼夢
(author) (
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)
National Institute for Materials Science
遠藤 頼夢
;
増田 卓也
(author) (
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)
https://orcid.org/0000-0001-7462-2177
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
増田 卓也
Keyword
オペランド
,
in situ
,
XPS
Date published
2023-08-07
Updated at
2024-12-02 16:30:52 +0900
全固体リチウムイオン電池配置でのSi負極のオペランド反応解析
Journal article
Creator
増田 卓也
(author) (
Search by this author
)
https://orcid.org/0000-0001-7462-2177
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
増田 卓也
Keyword
オペランド
,
in situ
,
XPS
,
AFM
Date published
Updated at
2024-12-06 17:17:59 +0900
Keyword
XPS
(8)
AES
(3)
IMFP
(2)
TPP-2M
(2)
in situ
(2)
オペランド
(2)
AFM
(1)
Auger electron spectroscopy
(1)
Band bending
(1)
DFT
(1)
IMFPs
(1)
ISO
(1)
Interface
(1)
International Organization for Standardization
(1)
MXene
(1)
Nb:YTaO4
(1)
Single-crystal structure analysis
(1)
Tb:YTaO4
(1)
X-ray photoelectron spectroscopy
(1)
binding energy calibration
(1)
carbon-related materials
(1)
diamond
(1)
electron inelastic mean free paths
(1)
elemental solids
(1)
number of valence electrons
(1)
quantitative surface analysis
(1)
relative sensitivity factor
(1)
surface analysis
(1)
surface sensitivity
(1)
RDE metadata def
RDE invoice schema
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