Keyword: atom probe tomography
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18 records found.

An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
Article
Creator
Jun Uzuhashi SAMURAI ORCID ; Tadakatsu Ohkubo SAMURAI ORCID ; Kazuhiro Hono SAMURAI ORCID
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy
Date published
2025-02-03
Updated at
2024-09-05 08:30:18 +0900
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials.pdf
Heating rate dependence of coercivity and microstructure of Fe–B–P–Cu nanocrystalline soft magnetic materials
Article
Creator
Yohei Nomura ; Jun Uzuhashi SAMURAI ORCID ; Tatsuya Tomita ; Toru Takahashi ; Hidenori Kuwata ; Taichi Abe SAMURAI ORCID ; Tadakatsu Ohkubo SAMURAI ORCID ; Kazuhiro Hono SAMURAI ORCID
Keyword
atom probe tomography
Date published
2020-11-06
Updated at
2024-04-05 10:56:21 +0900
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs.pdf
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
Proceedings
Creator
Ryo Tanaka ; Shinya Takashima ; Katsunori Ueno ; Masahiro Horita ; Jun Suda ; Jun Uzuhashi SAMURAI ORCID ; Tadakatsu Ohkubo SAMURAI ORCID ; Masaharu Edo
Keyword
gallium nitride, atom probe tomography, transmission electron microscopy
Date published
2023-06-08
Updated at
2024-04-19 12:30:23 +0900
X線・中性子小角散乱法及び3次元アトムプローブ法によるCu-Ni-Si合金中のδNi2Si析出相の解析.pdf
X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析
Article
Creator
佐々木 宏和 ; 秋谷 俊太 ; 三原 邦照 ; 大場 洋次郎 ; 大沼 正人 ; 埋橋 淳 SAMURAI ORCID ; 大久保 忠勝 SAMURAI ORCID
Keyword
atom probe tomography, transmission electron microscopy, Corson alloy
Date published
Updated at
2024-01-30 09:51:05 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation.pdf
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
Article
Creator
Emi Kano ; Keita Kataoka ; Jun Uzuhashi SAMURAI ORCID ; Kenta Chokawa ; Hideki Sakurai ; Akira Uedono ; Tetsuo Narita ; Kacper Sierakowski ; Michal Bockowski ; Ritsuo Otsuki ; Koki Kobayashi ; Yuta Itoh ; Masahiro Nagao ; Tadakatsu Ohkubo SAMURAI ORCID ; Kazuhiro Hono SAMURAI ORCID ; Jun Suda ; Tetsu Kachi ; Nobuyuki Ikarashi
Keyword
gallium nitride, transmission electron microscopy, atom probe tomography
Date published
2022-08-14
Updated at
2024-01-05 22:13:58 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells.pdf
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
Article
Creator
Yudai Yamaguchi ; Yuya Kanitani ; Yoshihiro Kudo ; Jun Uzuhashi SAMURAI ORCID ; Tadakatsu Ohkubo SAMURAI ORCID ; Kazuhiro Hono SAMURAI ORCID ; Shigetaka Tomiya
Keyword
InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
Date published
2022-09-14
Updated at
2024-01-05 22:12:51 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing.pdf
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
Article
Creator
Jun Uzuhashi SAMURAI ORCID ; Jun Chen SAMURAI ORCID ; Ashutosh Kumar ORCID ; Wei Yi ORCID ; Tadakatsu Ohkubo SAMURAI ORCID ; Ryo Tanaka ; Shinya Takashima ; Masaharu Edo ; Kacper Sierakowski ; Michal Bockowski ; Hideki Sakurai ; Tetsu Kachi ; Takashi Sekiguchi ORCID ; Kazuhiro Hono SAMURAI ORCID
Keyword
gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
Date published
2022-05-14
Updated at
2024-01-05 22:11:22 +0900
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM.pdf
Development of automated tip preparation for atom probe tomography by using script-controlled FIB-SEM
Article
Creator
Jun Uzuhashi SAMURAI ORCID ; Tadakatsu Ohkubo SAMURAI ORCID ; Kazuhiro Hono SAMURAI ORCID
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy, automation
Date published
2023-02-19
Updated at
2025-02-23 22:51:16 +0900