ライセンス: In Copyright キーワード: transmission electron microscopy
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3 件のレコードが見つかりました。

Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Corporation
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Corporation
;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
University of Tsukuba
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam.pdf
Stable and high current emission of electrons from a HfC nanoneedle field-emitter fabricated by focused ion beam
ジャーナル論文
著者
Shuai Tang (author) (この著者で検索)
; ORCID SAMURAI ;
Yimeng Wu (author) (この著者で検索)
;
You-Hu Chen (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ;
Lu-Chang Qin (author) (この著者で検索)
キーワード
electron emission, transmission electron microscopy, focused ion beam
刊行年月日
2025-03-06
更新時刻
2025-04-12 08:30:10 +0900
Atomic-Scale Multimodal Characterization of Self-Assembled InAs-InGaAlAs Quantum Dots.pdf
Atomic-Scale Multimodal Characterization of Self-Assembled InAs/InGaAlAs Quantum Dots
ジャーナル論文
著者
Yudai Yamaguchi (author) (この著者で検索)
;
Yuta Inaba (author) (この著者で検索)
;
Ryoji Arai (author) (この著者で検索)
;
Yuya Kanitani (author) (この著者で検索)
;
Yoshihiro Kudo (author) (この著者で検索)
;
Michinori Shiomi (author) (この著者で検索)
;
Daiji Kasahara (author) (この著者で検索)
;
Mikihiro Yokozeki (author) (この著者で検索)
;
Noriyuki Fuutagawa (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kouichi Akahane (author) (この著者で検索)
;
Naokatsu Yamamoto (author) (この著者で検索)
;
Shigetaka Tomiya (author) (この著者で検索)
キーワード
quantum dot, atom probe tomography, transmission electron microscopy
刊行年月日
2024-04-11
更新時刻
2025-04-14 16:30:23 +0900