Pulsed laser deposition of ZnO/MgxZn1-xO superlattices for quantum cascade laser applications
- ジャーナル論文
- 著者
-
;Tatsuya Masuda (author) (この著者で検索)a Smart Combinatorial Technology;Toshihiro Sato (author) (この著者で検索);Norihiko Sekine (author) (この著者で検索);Iwao Hosako (author) (この著者で検索);Gen-Ichi Hatakoshi (author) (この著者で検索);Hideomi Koinuma (author) (この著者で検索)Ryota Takahashi (author) (この著者で検索)
- キーワード
- Pulsed laser deposition, quantum cascade laser, ZnO/MgxZn1-xO superlattices
- 刊行年月日
- 2026-07-16
- 更新時刻
- 2026-07-17 14:49:14 +0900
Laser ablation process of CsPbBr3 heterostructures for light-emitting diode applications
- ジャーナル論文
- 著者
-
;Ryunosuke Kumagai (author) (この著者で検索)Nihon University a College of Engineering, Department of Electrical and Electronic Engineering;Ren Koguchi (author) (この著者で検索);Takuro Dazai (author) (この著者で検索);Toshihiro Sato (author) (この著者で検索);Hideomi Koinuma (author) (この著者で検索);Ryuzi Katoh (author) (この著者で検索)Ryota Takahashi (author) (この著者で検索)
- キーワード
- Halide perovskite, pulsed laser deposition, time resolved microwave conductivity, time resolved photoluminescence, light emitting diode
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-09-10 16:30:32 +0900
Sample data for X-ray visualization of local bending of the lattice planes (XR-V-LBLP)
- データセット
- 著者
-
YAGYU, Shinjiro (curator) (この著者で検索)National Institute for Materials Science
- キーワード
- X-ray diffraction topography
- 刊行年月日
- 2023-03-27
- 更新時刻
- 2023-03-27 16:02:33 +0900
Electronic modes induced by spin and charge perturbations in Mott and Kondo insulators
- ジャーナル論文
- 著者
-
Masanori Kohno (author) (この著者で検索)National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Quantum Materials Field/Quantum Material Properties Group
- キーワード
- Strongly correlated systems, Mott insulators, Electronic structure, Spin perturbation, Charge perturbation, Kondo insulators
- 刊行年月日
- 2025-12-03
- 更新時刻
- 2025-12-11 12:21:37 +0900
Phonon Anomaly and Local Distortion in Iron-Manganese-Based Elinvar Alloys
- ジャーナル論文
- 著者
-
;Yoshihiko Umemoto (author) (この著者で検索)Tohoku University Institute for Materials Research;Yoichi Ikeda (author) (この著者で検索);Takashi Honda (author) (この著者で検索);Daisuke Ishikawa (author) (この著者で検索);John A. Schneeloch (author) (この著者で検索);Jörg C. Neuefeind (author) (この著者で検索);Shinichiro Tozawa (author) (この著者で検索);Rie Umetsu (author) (この著者で検索);Despina Louca (author) (この著者で検索);Alfred Q.R. Baron (author) (この著者で検索)Masaki Fujita (author) (この著者で検索)
- キーワード
- Iron-manganese based alloy, Elinvar, martensitic transformation, phonon softening, local distortion
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-08-06 08:30:28 +0900
Motion of Two-Dimensional Excitons in Momentum Space Leads to Pseudospin Distribution Narrowing on the Bloch Sphere
- ジャーナル論文
- 著者
-
;Garima Gupta (author) (この著者で検索)Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
;
Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
;
Kausik Majumdar (author) (この著者で検索)
- キーワード
- 2D materials, Exciton Pseudospin, Valley Decoherence, Motional Narrowing, Polarization Contrast, MoS2
- 刊行年月日
- 2024-05-08
- 更新時刻
- 2025-07-29 12:30:27 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900