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全ての絞り込みを解除
Motion of Two-Dimensional Excitons in Momentum Space Leads to Pseudospin Distribution Narrowing on the Bloch Sphere
ジャーナル論文
著者
Garima Gupta
(author) (
この著者で検索
)
Garima Gupta
;
Kenji Watanabe
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3701-8119
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kenji Watanabe
;
Takashi Taniguchi
(author) (
この著者で検索
)
https://orcid.org/0000-0002-1467-3105
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Takashi Taniguchi
;
Kausik Majumdar
(author) (
この著者で検索
)
Kausik Majumdar
キーワード
2D materials
,
Exciton Pseudospin
,
Valley Decoherence
,
Motional Narrowing
,
Polarization Contrast
,
MoS2
刊行年月日
2024-05-08
更新時刻
2025-07-29 12:30:27 +0900
Emission control of longitudinal optical phonon resonant thermal terahertz radiation from two-dimensional surface metal micro-structures on GaAs
ジャーナル論文
著者
Takumi Oshima
(author) (
この著者で検索
)
Chiba University Graduate School of Science and Engineering
Takumi Oshima
;
Daiki Yoshikawa
(author) (
この著者で検索
)
Daiki Yoshikawa
;
Yoshihiro Ishitani
(author) (
この著者で検索
)
Yoshihiro Ishitani
キーワード
Longitudinal optical phonon
,
radiation emission by phonon
,
surface structures in the region keeping LO phonon coherence
,
polarization free by two dimendional structures
,
control of emission and exitinction by selecting the size of 2D emission window
刊行年月日
2026-09-21
更新時刻
2026-10-07 11:11:01 +0900
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0960-3812
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
SUMIYA, Masatomo
キーワード
GaN
,
Gallium nitride
,
Surface oxidation
,
Oxidation
,
MOS structure
,
XPS
,
SPring-8
刊行年月日
2022-12-31
更新時刻
2024-01-05 22:11:14 +0900
Antimony-modified porous lamellar zinc as reversible and stable anode for high-performance alkaline aqueous zinc-air battery
ジャーナル論文
著者
Muhammad Afiq Irfan Mohd Shumiri
(author) (
この著者で検索
)
Universiti Teknologi Malaysia a Materials Research and Consultancy Group, Faculty of Mechanical Engineering
Muhammad Afiq Irfan Mohd Shumiri
;
Hikari Sakaebe
(author) (
この著者で検索
)
Hikari Sakaebe
;
Abdillah Sani Mohd Najib
(author) (
この著者で検索
)
Abdillah Sani Mohd Najib
;
Nor Akmal Fadil
(author) (
この著者で検索
)
Nor Akmal Fadil
キーワード
metal-air batteries
,
Zn anode
,
dendrite-free
,
surface modification
,
structural design
,
cycle stability
刊行年月日
2026-12-31
更新時刻
2026-05-21 11:53:02 +0900
Continuous real-time O 1s core XPS spectra of initial O
2
molecule adsorption on polar and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0960-3812
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
SUMIYA, Masatomo
キーワード
GaN
,
Gallium nitride
,
Oxidation
,
Adsorption
,
XPS
,
SPring-8
刊行年月日
2020-11-19
更新時刻
2024-01-05 22:13:22 +0900
A design methodology of crystal growth furnace and process aided by two-step optimization using machine learning models and genetic algorithm
ジャーナル論文
著者
Hiroyuki Tanaka
(author) (
この著者で検索
)
Nagoya University a Graduate School of Engineering
Hiroyuki Tanaka
;
Kentaro Kutsukake
(author) (
この著者で検索
)
Kentaro Kutsukake
;
Kota Asakura
(author) (
この著者で検索
)
Kota Asakura
;
Takuto Kojima
(author) (
この著者で検索
)
Takuto Kojima
;
Xin Liu
(author) (
この著者で検索
)
Xin Liu
;
Noritaka Usami
(author) (
この著者で検索
)
Noritaka Usami
キーワード
Optimization
,
machine learning
,
genetic algorithm
,
crystal growth
,
process informatics
刊行年月日
2025-12-31
更新時刻
2026-02-27 12:30:07 +0900
Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO
ジャーナル論文
著者
Hirotaka Manaka
(author) (
この著者で検索
)
Kagoshima University a Graduate School of Science and Engineering
Hirotaka Manaka
;
Shoutarou Katayama
(author) (
この著者で検索
)
Shoutarou Katayama
;
Soichiro Honda
(author) (
この著者で検索
)
Soichiro Honda
;
Yoko Miura
(author) (
この著者で検索
)
Yoko Miura
キーワード
LSTM
,
temperature series principal component analysis
,
3D convolutional autoencoder
,
temperature series forest
,
stress-induced ferroelectricity
,
SrTiO3
刊行年月日
2025-12-31
更新時刻
2025-10-21 16:05:44 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
キーワード
Electrostatic Levitation
(267)
collection - Thermophys Datasets
(267)
VELF
(228)
Density
(163)
Alloy
(118)
Drop oscillation
(104)
Metal
(90)
Ceramic
(59)
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(39)
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(37)
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(37)
collection - MDR HAXPES DB
(37)
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(33)
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(9)
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(8)
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(8)
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(8)
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(6)
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(6)
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(6)
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(2)
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18.5mol%Y2O3-81.5mol%Al2O3
(1)
23.5mol%Y2O3-76.5mol%Al2O3
(1)
2D materials
(1)
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(1)
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(1)
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(1)
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(1)
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(1)
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(1)
RDEメタデータ定義
RDE送り状
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>
絞り込み
コレクション
Thermophysical Property Original Datasets(267)
MDR HAXPES DB(37)
SuperCon Knowledge Collection(3)
MDR SuperCon Datasheet(2)
MDR XAFS DB(1)
PoLyInfo Knowledge Collection(1)
資源タイプ
データセット(331)
ジャーナル論文(47)
その他(1)
ソフトウェア(1)
キーワード
Electrostatic Levitation (267)
collection - Thermophys Datasets (267)
VELF (228)
Density (163)
Alloy (118)
Drop oscillation (104)
Metal (90)
Ceramic (59)
SPring-8 (39)
BL46XU (37)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (315)
Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International (38)
In Copyright (11)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (10)
http://creativecommons.org/publicdomain/zero/1.0/ (1)
ファイル種別
application/zip (380)
text/plain (278)
image/png (261)
application/pdf (57)
application/json (39)
application/octet-stream (39)
text/csv (38)
text/tab-separated-values (38)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (2)
image/jpeg (2)
試料の化学組成
Ti (8)
Zr80O20 (6)
Zr90O10 (6)
Al2O3 (5)
Ir (5)
Mo (5)
Nb (5)
Re (5)
Ta (5)
Zr77Cr23 (5)
計測法
動的機械的分析 (267)
X線光電子分光法 (2)
X線光電子分光法 (1)
試料種別
シリコン (1)
試料の構造的特徴
溶融 (267)
装置名
VELF (228)
BL46XU_HAXPES (37)
ISS-ELF (33)
PESL (6)
BL23_XPS (2)
FASTCAM SA5 (1)
SPARQL Endpoint (1)
SPring-8 BL20B2 (1)
XPS SPring-8 BL15 (1)
装置型番
(6)