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14 件のレコードが見つかりました。 1件目から10件目まで表示します。

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GaN_H2O.jpg
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
データセット
著者
SUMIYA, Masatomo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
刊行年月日
2022-12-31
更新時刻
2024-01-05 22:11:14 +0900
データセット
Orthogonal spectroscopic assessment of higher-order structure of nucleic acids and its concentration-dependent polymorphism
データセット
著者
Taiji Oyama (author) (この著者で検索)
JASCO Corporation
;
Satoko Suzuki (author) (この著者で検索)
JASCO Corporation
;
Ken-ichi Akaoa (author) (この著者で検索)
JASCO Corporation
;
Kazunori Ikebukurob (author) (この著者で検索)
Tokyo University of Agriculture and Technology
;
Kohsaku Kawakami (author) (この著者で検索)
National Institute for Materials Science External Collaboration Division/Materials Open Platform for Pharmaceutical Science
ORCID SAMURAI ;
Tomohiko Yamazaki (author) (この著者で検索)
National Institute for Materials Science Research Center for Macromolecules and Biomaterials/Biomaterials Field/Medical Soft Matter Group
ORCID SAMURAI
キーワード
Circular Dichroism spectrum, Raman spectrum, Fourier Transform Infrared spectrum, Fluorescence spctrum, Atomic Force Microscope
刊行年月日
更新時刻
2026-08-27 15:52:20 +0900
TSTM-2025-0032.R1_graphical_abstract.pdf
Designing a Unified Data Structure for Solid-Electrolyte Research Projects
データセット
著者
Yasuhiro Fujiwara (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Application Unit
ORCID SAMURAI ;
Masahiko Demura (author) (この著者で検索)
National Institute for Materials Science Research Network and Facility Services Division
ORCID SAMURAI ;
Kazunori Takada (author) (この著者で検索)
National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Solid-State Battery Group
ORCID SAMURAI ;
Kota Suzuki (author) (この著者で検索)
Institute of Science Tokyo
;
Satoshi Hori (author) (この著者で検索)
Institute of Science Tokyo
;
Masaki Azuma (author) (この著者で検索)
Institute of Science Tokyo
;
Ryoji Kanno (author) (この著者で検索)
Institute of Science Tokyo
;
Yoshiyuki Inaguma (author) (この著者で検索)
Gakushuin University
;
Akitoshi Hayashi (author) (この著者で検索)
Osaka Metropolitan University
;
Yasutoshi Iriyama (author) (この著者で検索)
Graduate School of Engineering, Nagoya University
;
Hirotoshi Yamada (author) (この著者で検索)
Nagasaki University
;
Tetsuhiro Katsumata (author) (この著者で検索)
Tokai University
キーワード
process chain, data structure, data model, data management, Research Data Express, RDE, solid electrolytes
刊行年月日
2025-12-31
更新時刻
2025-12-19 08:30:30 +0900
Dataset
Machine extraction of polymer data from tables using XML versions of scientific articles
データセット
著者
YOSHIZAWA, Atsushi (author) (この著者で検索)
; ORCID SAMURAI ;
SHINDO, Hiroyuki (author) (この著者で検索)
ORCID ; ORCID SAMURAI ;
MATSUMOTO, Yuji (author) (この著者で検索)
ORCID
キーワード
polymer data, table, machine extraction, informatics, XML
刊行年月日
2021-01-01
更新時刻
2024-06-21 15:45:49 +0900
Dataset
Examples of SQS (special quasirandom structure) models for arbitrary binary bcc (body centered cubic) and hcp (hexagonal close packed) structures
データセット
著者
ORCID SAMURAI
キーワード
Sommerfeld model, quasi-harmonic vibrational contribution, First-principles calculation, Debye model, titanium alloys
刊行年月日
2020-10-15
更新時刻
2024-01-05 22:12:16 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
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