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Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO.pdf
Deep learning framework for analyzing birefringence imaging by incorporating optical polarization overlap in stress-induced ferroelectric SrTiO
ジャーナル論文
著者
Hirotaka Manaka (author) (この著者で検索)
Kagoshima University a Graduate School of Science and Engineering
;
Shoutarou Katayama (author) (この著者で検索)
;
Soichiro Honda (author) (この著者で検索)
;
Yoko Miura (author) (この著者で検索)
キーワード
LSTM, temperature series principal component analysis, 3D convolutional autoencoder, temperature series forest, stress-induced ferroelectricity, SrTiO3
刊行年月日
2025-12-31
更新時刻
2025-10-21 16:05:44 +0900
SI_revised_highlighted_new.pdf
A data-driven elucidation of the challenges in designing stable quinone derivatives for aqueous organic redox flow batteries: correlations between thermodynamics of chemical degradation and energy capacity metrics
ジャーナル論文
著者
Ning Lu (author) (この著者で検索)
RWTH Aachen University a MODES, the Integrated Fuel & Chemical Science Centre
;
Shiyao Ju (author) (この著者で検索)
;
Daniel Willimetz (author) (この著者で検索)
;
Shengming Tang (author) (この著者で検索)
;
Abhishek Khetan (author) (この著者で検索)
キーワード
Aqueous organic redox flow batteries, quinone stability, degradation, molecular design, high-throughput screening, durability, grid-scale energy storage
刊行年月日
2026-07-16
更新時刻
2026-07-17 13:28:23 +0900
Reference compositions for bismuth telluride thermoelectric materials for low-temperature power generation .pdf
Reference compositions for bismuth telluride thermoelectric materials for low-temperature power generation
ジャーナル論文
著者
Nirma Kumari (author) (この著者で検索)
Korea Electrotechnology Research Institute (KERI) a Energy Conversion Research Center, Electrical Materials Division
;
Jaywan Chung (author) (この著者で検索)
;
Seunghyun Oh (author) (この著者で検索)
;
Jeongin Jang (author) (この著者で検索)
;
Jongho Park (author) (この著者で検索)
;
Ji Hui Son (author) (この著者で検索)
;
SuDong Park (author) (この著者で検索)
;
Byungki Ryu (author) (この著者で検索)
キーワード
Reference composition, Thermoelectric, Bi0.46Sb1.54Te3, Bi2Te2.7Se0.3, BiTe system, Data-Driven
刊行年月日
2025-12-31
更新時刻
2025-11-13 08:30:20 +0900
Current status of room temperature magnetic compensation in impurity-doped Mn4N epitaxial thin films.pdf
Current status of room temperature magnetic compensation in impurity-doped Mn4N epitaxial thin films
ジャーナル論文
著者
Tomohiro Yasuda (author) (この著者で検索)
University of Tsukuba a Degree Programs in Pure and Applied Sciences, Graduate School of Science and Technology
;
Takashi Suemasu (author) (この著者で検索)
キーワード
Ferrimagnet, Mn4N, magnetic compensation, XAS, XMCD, AHE
刊行年月日
2026-12-31
更新時刻
2026-06-24 11:43:16 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900