ファイル種別: application/zip

23 件のレコードが見つかりました。 11件目から20件目まで表示します。

Probing the hall anomaly and electronic structure in kagome metal RbV3Sb5 under hydrostatic pressure.pdf
Probing the Hall anomaly and electronic structure in kagome metal RbV3Sb5 under hydrostatic pressure
ジャーナル論文
著者
Tsz Fung Poon (author) (この著者で検索)
The Chinese University of Hong Kong a Department of Physics
;
Zheyu Wang (author) (この著者で検索)
;
Lingfei Wang (author) (この著者で検索)
;
Ying Kit Tsui (author) (この著者で検索)
;
Zikai Zhou (author) (この著者で検索)
;
Wenyan Wang (author) (この著者で検索)
;
Chun Wai Tsang (author) (この著者で検索)
;
Alexandre Pourret (author) (この著者で検索)
;
Gabriel Seyfarth (author) (この著者で検索)
;
Georg Knebel (author) (この著者で検索)
;
Swee K. Goh (author) (この著者で検索)
キーワード
Kagome superconductor, Fermiology, high pressure, quantum oscillations, non-monotonic Hall effect, mobility spectrum analysis
刊行年月日
2026-12-31
更新時刻
2026-06-10 10:49:39 +0900

Manuscript_clean.pdf
Machine learning prediction of Young's modulus in multi component titanium based biomedical alloys using extended thermodynamic descriptors
ジャーナル論文
著者
Hassan Ahmad (author) (この著者で検索)
Pakistan Institute of Engineering and Applied Sciences (PIEAS) Department of Metallurgy and Materials Engineering
;
Muhammad Haider (author) (この著者で検索)
;
Zafar Iqbal (author) (この著者で検索)
;
Muhammad Zarif (author) (この著者で検索)
;
Syed Mujtaba Ul Hassan (author) (この著者で検索)
キーワード
Titanium alloys, machine learning, biomedical alloys, Young’s modulus prediction
刊行年月日
2026-12-31
更新時刻
2026-07-08 16:58:38 +0900

HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900

HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900

HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900

HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900

HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900

HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900

HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900

絞り込み