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論文・データセット
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ジャーナル論文(15)
データセット(8)
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Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
3D convolutional autoencoder (1)
AHE (1)
Aqueous organic redox flow batteries (1)
Bi0.46Sb1.54Te3 (1)
Bi2Te2.7Se0.3 (1)
BiTe system (1)
CP precipitative coating (1)
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全ての絞り込みを解除
23 件のレコードが見つかりました。 11件目から20件目まで表示します。
全ての絞り込みを解除
Fluorinated Glycidyl Triazolyl Polymers Exhibiting Thermally Stable Layered Structures and Sticky Hydrophobic Surfaces
ジャーナル論文
著者
Taichi Ikeda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-6650-5798
NIMS Researchers Directory SAMURAI
Taichi Ikeda
;
Masafumi Yoshio
(author) (
この著者で検索
)
https://orcid.org/0000-0002-1442-4352
NIMS Researchers Directory SAMURAI
Masafumi Yoshio
キーワード
Fluorinated polymers
,
Liquid-crystal polymers
,
Post-polymerization functionalization
,
Click chemistry
,
Contact angle hysteresis
,
Sticky hydrophobic surface
刊行年月日
2026-02-27
更新時刻
2026-03-13 08:30:08 +0900
Probing the Hall anomaly and electronic structure in kagome metal RbV3Sb5 under hydrostatic pressure
ジャーナル論文
著者
Tsz Fung Poon
(author) (
この著者で検索
)
The Chinese University of Hong Kong a Department of Physics
Tsz Fung Poon
;
Zheyu Wang
(author) (
この著者で検索
)
Zheyu Wang
;
Lingfei Wang
(author) (
この著者で検索
)
Lingfei Wang
;
Ying Kit Tsui
(author) (
この著者で検索
)
Ying Kit Tsui
;
Zikai Zhou
(author) (
この著者で検索
)
Zikai Zhou
;
Wenyan Wang
(author) (
この著者で検索
)
Wenyan Wang
;
Chun Wai Tsang
(author) (
この著者で検索
)
Chun Wai Tsang
;
Alexandre Pourret
(author) (
この著者で検索
)
Alexandre Pourret
;
Gabriel Seyfarth
(author) (
この著者で検索
)
Gabriel Seyfarth
;
Georg Knebel
(author) (
この著者で検索
)
Georg Knebel
;
Swee K. Goh
(author) (
この著者で検索
)
Swee K. Goh
キーワード
Kagome superconductor
,
Fermiology
,
high pressure
,
quantum oscillations
,
non-monotonic Hall effect
,
mobility spectrum analysis
刊行年月日
2026-12-31
更新時刻
2026-06-10 10:49:39 +0900
Machine learning prediction of Young's modulus in multi component titanium based biomedical alloys using extended thermodynamic descriptors
ジャーナル論文
著者
Hassan Ahmad
(author) (
この著者で検索
)
Pakistan Institute of Engineering and Applied Sciences (PIEAS) Department of Metallurgy and Materials Engineering
Hassan Ahmad
;
Muhammad Haider
(author) (
この著者で検索
)
Muhammad Haider
;
Zafar Iqbal
(author) (
この著者で検索
)
Zafar Iqbal
;
Muhammad Zarif
(author) (
この著者で検索
)
Muhammad Zarif
;
Syed Mujtaba Ul Hassan
(author) (
この著者で検索
)
Syed Mujtaba Ul Hassan
キーワード
Titanium alloys
,
machine learning
,
biomedical alloys
,
Young’s modulus prediction
刊行年月日
2026-12-31
更新時刻
2026-07-08 16:58:38 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
キーワード
Auger depth profiling analysis
(8)
HfO2/Si
(8)
Ultra low angle incidence ion beam
(8)
3D convolutional autoencoder
(1)
AHE
(1)
Aqueous organic redox flow batteries
(1)
Bi0.46Sb1.54Te3
(1)
Bi2Te2.7Se0.3
(1)
BiTe system
(1)
CP precipitative coating
(1)
Click chemistry
(1)
Contact angle hysteresis
(1)
Data-Driven
(1)
Fermiology
(1)
Ferrimagnet
(1)
Fluorinated polymers
(1)
Kagome superconductor
(1)
LSTM
(1)
Liquid-crystal polymers
(1)
Mn4N
(1)
Neuromorphic
(1)
Post-polymerization functionalization
(1)
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(1)
RNA-seq
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Silver nanowire network
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Titanium alloys
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Word
(1)
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Young’s modulus prediction
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Zn anode
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ZnO/MgxZn1-xO superlattices
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aging
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bioceramic nanoparticles
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biological sex
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crystal structure
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dataset Template
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(1)
high pressure
(1)
high-pressure synthesis
(1)
high-throughput screening
(1)
high-throughput virtual screening
(1)
learning
(1)
machine learning
(1)
macrophages
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magnetic compensation
(1)
materials informatics
(1)
mechanical properties
(1)
melting point
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(1)
metal-air batteries
(1)
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(1)
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(1)
molecular design
(1)
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(1)
nanopore
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(1)
non-monotonic Hall effect
(1)
optoelectronic properties
(1)
quantum cascade laser
(1)
quantum oscillations
(1)
quinone stability
(1)
silica–titania nanohybrid
(1)
simulated body fluid
(1)
stress-induced ferroelectricity
(1)
structural design
(1)
surface modification
(1)
temperature series forest
(1)
temperature series principal component analysis
(1)
uptake
(1)
work function
(1)
workflow automation
(1)
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絞り込み
コレクション
資源タイプ
ジャーナル論文(15)
データセット(8)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
3D convolutional autoencoder (1)
AHE (1)
Aqueous organic redox flow batteries (1)
Bi0.46Sb1.54Te3 (1)
Bi2Te2.7Se0.3 (1)
BiTe system (1)
CP precipitative coating (1)
(more)
ライセンス
Creative Commons BY Attribution 4.0 International (14)
In Copyright (8)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
ファイル種別
application/pdf (23)
application/zip (23)
application/x-rar-compressed;version=5 (1)