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66 件のレコードが見つかりました。 21件目から30件目まで表示します。

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Supplemental_material_v4.pdf
Computational material screening for electrode materials of BaSi2 solar cells
ジャーナル論文
著者
Tomoaki Yazaki (author) (この著者で検索)
University of Yamanashi a Center for Crystal Science and Technology
;
Keisuke Arimoto (author) (この著者で検索)
;
Junji Yamanaka (author) (この著者で検索)
;
Kosuke O. Hara (author) (この著者で検索)
キーワード
Solar cells, metallic electrode, high-throughput virtual screening, work function, melting point, density functional theory
刊行年月日
2026-12-31
更新時刻
2026-03-07 12:30:04 +0900
データセット
Orthogonal spectroscopic assessment of higher-order structure of nucleic acids and its concentration-dependent polymorphism
データセット
著者
Taiji Oyama (author) (この著者で検索)
JASCO Corporation
;
Satoko Suzuki (author) (この著者で検索)
JASCO Corporation
;
Ken-ichi Akaoa (author) (この著者で検索)
JASCO Corporation
;
Kazunori Ikebukurob (author) (この著者で検索)
Tokyo University of Agriculture and Technology
;
Kohsaku Kawakami (author) (この著者で検索)
National Institute for Materials Science External Collaboration Division/Materials Open Platform for Pharmaceutical Science
ORCID SAMURAI ;
Tomohiko Yamazaki (author) (この著者で検索)
National Institute for Materials Science Research Center for Macromolecules and Biomaterials/Biomaterials Field/Medical Soft Matter Group
ORCID SAMURAI
キーワード
Circular Dichroism spectrum, Raman spectrum, Fourier Transform Infrared spectrum, Fluorescence spctrum, Atomic Force Microscope
刊行年月日
更新時刻
2026-08-27 15:52:20 +0900
published_version.pdf
Electronic modes induced by spin and charge perturbations in Mott and Kondo insulators
ジャーナル論文
著者
Masanori Kohno (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Quantum Materials Field/Quantum Material Properties Group
ORCID SAMURAI
キーワード
Strongly correlated systems, Mott insulators, Electronic structure, Spin perturbation, Charge perturbation, Kondo insulators
刊行年月日
2025-12-03
更新時刻
2025-12-11 12:21:37 +0900
paper.pdf
Wet etching of (−102) β-Ga 2 O 3 with tetramethylammonium hydroxide (TMAH)
ジャーナル論文
著者
ORCID SAMURAI
キーワード
Ga2O3, wet etching, TMAH
刊行年月日
2026-12-31
更新時刻
2026-06-11 15:11:01 +0900
sciadv.adg3289_sm.pdf
Neuromorphic learning, working memory, and metaplasticity in nanowire networks
ジャーナル論文
著者
Alon Loeffler (author) (この著者で検索)
The University of Sydney School of Physics
;
Adrian Diaz-Alvarez (author) (この著者で検索)
NIMS International Center for Young Scientists (ICYS)
;
Ruomin Zhu (author) (この著者で検索)
The University of Sydney School of Physics
;
Natesh Ganesh (author) (この著者で検索)
National Institute of Standards and Technology (NIMS)
;
James M. Shine (author) (この著者で検索)
The University of Sydney School of Physics
;
Tomonobu Nakayama (author) (この著者で検索)
NIMS International Center for Materials Nanoarchitectonics (MANA)
ORCID SAMURAI ;
Zdenka Kuncic (author) (この著者で検索)
The University of Sydney School of Physics
キーワード
Neuromorphic, Silver nanowire network, neurosynaptic connectivity, emergent dynamics, metaplasticity, learning, memory
刊行年月日
2023-04-21
更新時刻
2024-01-05 22:11:55 +0900
Dataset
XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
データセット
著者
SUMIYA, Masatomo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
XPS, SPring-8 BL15, Si
刊行年月日
更新時刻
2024-05-24 08:30:24 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
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