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- Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International (38)
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390 records found.
Original dataset for ID 1 Nb in Thermophysical Property Database
- Dataset
- Collection
- Thermophysical Property Original Datasets
- Creator
-
;Takehiko Ishikawa (depositor) (Search by this author)Japan Aerospace Exploration AgencyMasashi Ishii (editor) (Search by this author)National Institute for Materials Science
- Keyword
- Nb, Metal, Density, VELF, Electrostatic Levitation, collection - Thermophys Datasets
- Date published
- Updated at
- 2024-03-30 18:34:17 +0900
Neuromorphic learning, working memory, and metaplasticity in nanowire networks
- Journal article
- Creator
-
;Alon Loeffler (author) (Search by this author)School of Physics, The University of Sydney;Adrian Diaz-Alvarez (author) (Search by this author)International Center for Young Scientists (ICYS), NIMS;Ruomin Zhu (author) (Search by this author)School of Physics, The University of Sydney;Natesh Ganesh (author) (Search by this author)National Institute of Standards and Technology (NIMS);James M. Shine (author) (Search by this author)School of Physics, The University of SydneyTomonobu Nakayama (author) (Search by this author)International Center for Materials Nanoarchitectonics (MANA), NIMS
;
Zdenka Kuncic (author) (Search by this author)School of Physics, The University of Sydney
- Keyword
- Neuromorphic, Silver nanowire network, neurosynaptic connectivity, emergent dynamics, metaplasticity, learning, memory
- Date published
- 2023-04-21
- Updated at
- 2024-01-05 22:11:55 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-03-30 18:50:38 +0900
SuperCon RDF Ver. 1.0
- Dataset
- Collection
- SuperCon Knowledge Collection
- Creator
-
Masashi Ishii (author) (Search by this author)National Institute for Materials Science
- Keyword
- SuperCon, Superconductors, RDF, Ontology, Semantic Web, SPARQL
- Date published
- Updated at
- 2023-12-25 00:32:34 +0900
Sample data for X-ray visualization of local bending of the lattice planes (XR-V-LBLP)
- Dataset
- Creator
-
YAGYU, Shinjiro (curator) (Search by this author)National Institute for Materials Science
- Keyword
- X-ray diffraction topography
- Date published
- 2023-03-27
- Updated at
- 2023-03-27 16:02:33 +0900
Continuous real-time O 1s core XPS spectra of H2O adsorption on +c Ga-face and m-plane surfaces of GaN
- Dataset
- Creator
-
SUMIYA, Masatomo (author) (Search by this author)National Institute for Materials Science
- Keyword
- GaN, Gallium nitride, Surface oxidation, Oxidation, MOS structure, XPS, SPring-8
- Date published
- 2022-12-31
- Updated at
- 2024-01-05 22:11:14 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-03-30 18:50:25 +0900
Continuous real-time O 1s core XPS spectra of initial O2 molecule adsorption on polar and m-plane surfaces of GaN
- Dataset
- Creator
-
SUMIYA, Masatomo (author) (Search by this author)National Institute for Materials Science
- Keyword
- GaN, Gallium nitride, Oxidation, Adsorption, XPS, SPring-8
- Date published
- 2020-11-19
- Updated at
- 2024-01-05 22:13:22 +0900
MaterialBERT for Natural Language Processing of Materials Science Texts
- Journal article
- Creator
-
;KAWANO, Hiroyuki (author) (Search by this author)Ridgelinez Limited;SATO, Fumitaka (author) (Search by this author)Ridgelinez LimitedYOSHITAKE, Michiko (author) (Search by this author)MaDIS, National Institute for Materials Science
;
;MOTEKI, Fuma (operator) (Search by this author)Ridgelinez LimitedTERAOKA, Hiroshi (author) (Search by this author)Ridgelinez Limited
- Keyword
- word embedding, pre-training, BERT, literal information
- Date published
- Updated at
- 2025-04-15 08:30:11 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-01-05 22:12:25 +0900