ファイル種別: application/pdf キーワード: atom probe tomography
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4 件のレコードが見つかりました。 1件目から4件目まで表示します。

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Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs.pdf
Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs
プロシーディングス論文
著者
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Katsunori Ueno (author) (この著者で検索)
Fuji Electric Co., Ltd.
;
Masahiro Horita (author) (この著者で検索)
Nagoya Univ.
;
Jun Suda (author) (この著者で検索)
Nagoya Univ.
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Co., Ltd.
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy
刊行年月日
2023-06-08
更新時刻
2024-04-19 12:30:23 +0900
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells.pdf
Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells
ジャーナル論文
著者
Yudai Yamaguchi (author) (この著者で検索)
;
Yuya Kanitani (author) (この著者で検索)
;
Yoshihiro Kudo (author) (この著者で検索)
;
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Shigetaka Tomiya (author) (この著者で検索)
キーワード
InGaN, dislocation, pipe diffusion, atom probe tomography, transmission electron microscopy
刊行年月日
2022-09-14
更新時刻
2024-01-05 22:12:51 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer.pdf
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
Fuji Electric Corporation
;
Shinya Takashima (author) (この著者で検索)
Fuji Electric Corporation
;
Masaharu Edo (author) (この著者で検索)
Fuji Electric Corporation
;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
ORCID SAMURAI ;
Takashi Sekiguchi (author) (この著者で検索)
University of Tsukuba
キーワード
gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
刊行年月日
2024-08-07
更新時刻
2024-08-03 08:30:15 +0900
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing.pdf
Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
ジャーナル論文
著者
Jun Uzuhashi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Jun Chen (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Ashutosh Kumar (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Wei Yi (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Tadakatsu Ohkubo (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Ryo Tanaka (author) (この著者で検索)
;
Shinya Takashima (author) (この著者で検索)
;
Masaharu Edo (author) (この著者で検索)
;
Kacper Sierakowski (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
;
Hideki Sakurai (author) (この著者で検索)
;
Tetsu Kachi (author) (この著者で検索)
;
Takashi Sekiguchi (author) (この著者で検索)
National Institute for Materials Science
ORCID ;
Kazuhiro Hono (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
gallium nitride, implantation, atom probe tomography, cathodoluminescence, scanning transmission electron microscopy
刊行年月日
2022-05-14
更新時刻
2024-01-05 22:11:22 +0900
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