- X-ray photoelectron spectroscopy (7)
- Bayesian estimation (3)
- Exchange Monte Carlo method (2)
- SESSA (2)
- Automatic spectrum analysis (1)
- Bayesian information criterion (1)
- Expectation– conditional maximisation algorithm (1)
- High-throughput analysis (1)
- Maximum a posteriori estimation (1)
- Multiple core level spectra (1)
7 records found.
A data-driven surrogate model for X-ray photoelectron spectroscopy based on survey spectrum background features
- Journal article
- Creator
-
;Shunichi Yoneda (author) (Search by this author)Ryo Murakami (author) (Search by this author)National Institute for Materials Science
;
Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
Shigeo Tanuma (author) (Search by this author)National Institute for Materials Science
;
;Hiromi Tanaka (author) (Search by this author);Hayaru Shouno (author) (Search by this author)Kenji Nagata (author) (Search by this author)National Institute for Materials Science
- Keyword
- X-ray photoelectron spectroscopy, Survey spectrum, Surrogate model, Total electron attenuation length, Thickness estimation
- Date published
- 2026-03-31
- Updated at
- 2026-04-16 15:42:06 +0900
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
- Journal article
- Creator
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;Atsushi Machida (author) (Search by this author)Kenji Nagata (author) (Search by this author)National Institute for Materials Science
;
Ryo Murakami (author) (Search by this author)National Institute for Materials Science
;
Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
;Hayaru Shouno (author) (Search by this author)Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
Masato Okada (author) (Search by this author)
- Keyword
- X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
- Date published
- 2024-05-29
- Updated at
- 2025-11-10 12:30:27 +0900
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
- Journal article
- Creator
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Hiroshi Shinotsuka (author) (Search by this author)National Institute for Materials Science
;
Kenji Nagata (author) (Search by this author)National Institute for Materials Science
;
Hideki Yoshikawa (author) (Search by this author)National Institute for Materials Science
;
;Shuichi Ogawa (author) (Search by this author)Akitaka Yoshigoe (author) (Search by this author)
- Keyword
- Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
- Date published
- 2024-12-03
- Updated at
- 2025-01-21 12:30:34 +0900
Maximum a posteriori estimation for high-throughput peak fitting in X-ray photoelectron spectroscopy
- Journal article
- Creator
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;Tarojiro Matsumura (author) (Search by this author)Naoka Nagamura (author) (Search by this author)National Institute for Materials Science
;
;Shotaro Akaho (author) (Search by this author)Kenji Nagata (author) (Search by this author)National Institute for Materials Science
;
Yasunobu Ando (author) (Search by this author)
- Keyword
- High-throughput analysis, Peak fitting, X-ray photoelectron spectroscopy, Maximum a posteriori estimation, Expectation– conditional maximisation algorithm
- Date published
- 2024-12-31
- Updated at
- 2024-12-10 16:30:32 +0900
Ultraviolet Light-Induced Surface Changes of Tungsten Oxide in Air: Combined Scanning Transmission Electron Microscopy and X-ray Photoelectron Spectroscopy Analysis
- Journal article
- Creator
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;Yuki Nakagawa (author) (Search by this author)Fuclty of Engineering, Hokkaido University / 北海道大学 工学研究院;Yasuhiro Shiratsuchi (author) (Search by this author)Hokkaido University;Tamaki Shibayama (author) (Search by this author)Fuclty of Engineering, Hokkaido University / 北海道大学 工学研究院Masaki Takeguchi (author) (Search by this author)Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group, National Institute for Materials Science
- Keyword
- tungsten oxide, photocatalysis, dentical-location scanning transmission electron microscopy, X-ray photoelectron spectroscopy, ultraviolet light, hydrocarbon decomposition
- Date published
- 2024-09-13
- Updated at
- 2024-09-20 08:30:15 +0900
Sample structure prediction from measured XPS data using Bayesian estimation and SESSA simulator
- Journal article
- Creator
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Hiroshi Shinotsuka (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
Kenji Nagata (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
;Malinda Siriwardana (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials ScienceHideki Yoshikawa (author) (Search by this author)Research and Services Division of Materials Data and Integrated System, National Institute for Materials Science
;
Hayaru Shouno (author) (Search by this author)
https://orcid.org/0000-0002-2412-0184
(unauthenticated)
Graduate School of Informatics and Engineering, The University of Electro-Communications
;
Masato Okada (author) (Search by this author)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
Graduate School of Frontier Science, The University of Tokyo
- Keyword
- X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
- Date published
- 2023-07-06
- Updated at
- 2024-01-05 22:11:57 +0900
Development of multiple core-level XPS spectra decomposition method based on the Bayesian information criterion
- Journal article
- Creator
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Shinotsuka Hiroshi (author) (Search by this author)
;
Nagata, Kenji (author) (Search by this author)
;
;Murakami, Ryo (author) (Search by this author);Tanaka, Hiromi (author) (Search by this author);Shouno, Hayaru (author) (Search by this author)Yoshikawa, Hideki (author) (Search by this author)
- Keyword
- Automatic spectrum analysis, Bayesian information criterion, Multiple core level spectra, X-ray photoelectron spectroscopy
- Date published
- 2020-10-03
- Updated at
- 2024-01-05 22:13:27 +0900