Keyword: AES
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4 records found.

06_プラハ_2006-1_cor.pdf
Determination of Inelastic Mean Free Paths in Elemental Solids in the 200 to 5000 eV Energy Range by Absolute Elastic Peak Electron Spectroscopy
Conference presentation
Creator
ORCID SAMURAI ;
Okamoto, N (author) (Search by this author)
物質・材料研究機構
;
Azuma, Y (author) (Search by this author)
;
Kimura, T (author) (Search by this author)
物質・材料研究機構
;
Goto, K (author) (Search by this author)
名古屋工業大学
Keyword
IMFP, TPP-2M, AES, XPS
Date published
2006-09-24
Updated at
2023-07-07 09:23:43 +0900
07 Vol.14 No.1 9-19.pdf
オージェ電子分光法における背面散乱補正　I．広い分析条件で使用可能な電子の背面散乱補正式の開発
Journal article
Creator
田沼 繁夫 (author) (Search by this author)
分析支援ステーション, 物質・材料研究機構
ORCID SAMURAI
Keyword
Auger electron spectroscopy, AES, electron backscattering correction, predictive formula for back scattering correction
Date published
2018-10-19
Updated at
2024-01-05 22:13:01 +0900
Figures.pdf
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
Journal article
Creator
ORCID SAMURAI ;
Powell, C. J. (author) (Search by this author)
ORCID ;
Penn, D. R. (author) (Search by this author)
Keyword
IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
Date published
2003-02-11
Updated at
2022-10-03 01:54:38 +0900
Summary_of_ISO18118-2.pdf
Summary of ISO/TC 201 Standard: XX ISO 18118: 2004 — Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy —Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
Journal article
Creator
ORCID SAMURAI
Keyword
XPS, quantitative surface analysis, X-ray photoelectron spectroscopy, Auger electron spectroscopy, relative sensitivity factor, ISO, International Organization for Standardization, AES
Date published
2005-12-28
Updated at
2024-01-05 22:11:34 +0900