3 件のレコードが見つかりました。
Overestimation of Operational Stability in Polymer-Based Organic Field-Effect Transistors Caused by Contact Resistance
- ジャーナル論文
- 著者
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Kenji Sakamoto (author) (この著者で検索)National Institute for Materials Science
;
Takeshi Yasuda (author) (この著者で検索)National Institute for Materials Science
;
Takeo Minari (author) (この著者で検索)National Institute for Materials Science
;
Masafumi Yoshio (author) (この著者で検索)National Institute for Materials Science
;
Junpei Kuwabara (author) (この著者で検索)
https://orcid.org/0000-0002-9032-5655
(unauthenticated)
;
Masayuki Takeuchi (author) (この著者で検索)National Institute for Materials Science
- キーワード
- polymer-based organic field-effect transistors, bias-stress effects, contact resistance, modified transmission line method, operational stability
- 刊行年月日
- 2024-12-11
- 更新時刻
- 2025-12-04 16:39:15 +0900
Locally Doped Transferred Contacts for WSe2 Transistors
- ジャーナル論文
- 著者
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He-Yu Chen (author) (この著者で検索)
https://orcid.org/0009-0004-7101-9179
(unauthenticated)
;
Jheng-Jie Lin (author) (この著者で検索)
https://orcid.org/0009-0002-1263-9453
(unauthenticated)
;
;Sheng-Shong Wong (author) (この著者で検索);Zhen-You Lin (author) (この著者で検索)Yu-Chiang Hsieh (author) (この著者で検索)
https://orcid.org/0009-0001-3346-9548
(unauthenticated)
;
;Kuo-En Chang (author) (この著者で検索);Chung-Lin Wu (author) (この著者で検索)Kenji Watanabe (author) (この著者で検索)
;
Takashi Taniguchi (author) (この著者で検索)
;
;Tse-Ming Chen (author) (この著者で検索)Luke W. Smith (author) (この著者で検索)
https://orcid.org/0000-0003-2194-4708
(unauthenticated)
- キーワード
- 2D field-effect transistors, contact resistance, WSe2
- 刊行年月日
- 2024-11-26
- 更新時刻
- 2025-02-05 16:30:33 +0900
Approach to Low Contact Resistance Formation on Buried Interface in Oxide Thin-Film Transistors: Utilization of Palladium-Mediated Hydrogen Pathway
- ジャーナル論文
- 著者
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Yuhao Shi (author) (この著者で検索)
https://orcid.org/0000-0002-7956-193X
(unauthenticated)
;
Masatake Tsuji (author) (この著者で検索)
https://orcid.org/0000-0002-3404-6037
(unauthenticated)
;
Hanjun Cho (author) (この著者で検索)
https://orcid.org/0009-0009-2834-8846
(unauthenticated)
;
Shigenori Ueda (author) (この著者で検索)National Institute for Materials Science
;
Junghwan Kim (author) (この著者で検索)
https://orcid.org/0000-0001-9168-6260
(unauthenticated)
;
Hideo Hosono (author) (この著者で検索)National Institute for Materials Science
- キーワード
- oxide semiconductors, IGZO, thin-film transistors, contact resistance, palladium, hydrogen
- 刊行年月日
- 2024-04-02
- 更新時刻
- 2024-04-08 16:30:22 +0900