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Surface Science Society of Japan
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Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy, Qu...
Auger Depth Profiling Analyses of InP/GaInAsP Multilayers
Auger Depth Profile Analysis of GaAs/AIAs Thin Film by Synthesized Spectrum Method Usi...
Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spect...
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Ef...
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Type of work
Publication
5
Keyword
Auger depth profiling analysis
3
Auger Depth Profiling Analysis
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InP/GaInAsP multilayer specimens
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Argon Ion Spot Beam
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GaAs/AlAs multilayer
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Japanese
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Publisher
Surface Science Society of Japan
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open
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In Copyright
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Material/Specimen
InP/GaInAsP multilayer specimens
2
GaAs/AlAs multilayer
1
InP/GaInAsP Multilayer
1
InP/GaInAsP Multilayers
1
Author
OGIWARA, Toshiya
4
TANUMA, Shigeo
4
HARADA, Tomoko
1
Ikeo, Nobuyuki
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Nagasawa, Yuji
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Journal of The Surface Science Society of Japan
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