Index Catalog // MDR

Description/Abstract:: The surface oxidation behavior of different GaN surfaces (the polar Ga-face (+c) and the nonpolar m-plane) under H<sub>2</sub>O vapor amb...
Keyword:: GaN, Gallium nitride, MOS structure, Oxidation, SPring-8, Surface oxidation, and XPS
Resource Type:: Dataset
Data origin:: other
Author:: SUMIYA, Masatomo
Date Uploaded:: 14/02/2023
Date Modified:: 28/02/2023

Description/Abstract:: The initial adsorption behavior of different GaN surfaces (the polar Ga-face (+c) and N-face (−c) and the nonpolar (101̅0) (m)-plane) und...
Keyword:: Adsorption, GaN, Gallium nitride, Oxidation, SPring-8, and XPS
Resource Type:: Dataset
Data origin:: other
Author:: SUMIYA, Masatomo
Date Uploaded:: 31/01/2023
Date Modified:: 28/02/2023

Description/Abstract:: ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative ana...
Keyword:: AES, Auger electron spectroscopy, ISO, International Organization for Standardization, X-ray photoelectron spectroscopy, XPS, quantitative surface analysis, and relative sensitivity factor
Resource Type:: Article
Author:: TANUMA, Shigeo
Journal:: Surface and Interface Analysis
Date Uploaded:: 08/10/2020
Date Modified:: 01/07/2021

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