Index Catalog // MDR

Description/Abstract:: 本論文は過去に報告した下記４報の論文についての総説であり、独自に開発したオペランドXPSおよびAFMにより、全固体電池配置のシリコン負極にリチウムが挿入・脱離する反応をその場観察した結果について解説している。 R. Endo, T. Ohnishi, K. Tak...
Keyword:: AFM, XPS, in situ, and オペランド
Resource Type:: Article
Author:: 増田卓也
Journal:: Journal of the Society of Inorganic Materials, Japan
Date Uploaded:: 06/12/2024

Description/Abstract:: X 線光電子分光法 (X-ray photoelectron spectroscopy, XPS) は, 試料表面の元素組成・化学状態を解析できる手法であり, 放射光施設での測定を中心に二次電池を含むエネルギーデバイスのその場・実働環境観察への展開が進んでいる. 本稿で...
Keyword:: XPS, in situ, and オペランド
Resource Type:: Article
Author:: 遠藤頼夢 and 増田卓也
Journal:: Journal of Surface Analysis
Date Uploaded:: 02/12/2024

Description/Abstract:: Due to the presence of an intrinsic C 1s peak in diamond, it is impossible to calibrate its binding energies using the adventitious C 1s ...
Keyword:: Band bending, XPS, binding energy calibration, carbon-related materials, and diamond
Resource Type:: Article
Author:: J. W. Liu, T. Teraji, B. Da, and Y. Koide
Journal:: APPLIED PHYSICS LETTERS
Date Uploaded:: 13/09/2024

Description/Abstract:: Siウェハーおよび測定条件の違いによるXPSスペクトルの変化を測定したXPSスペクトルデータセット。SPring-8 BL15で測定。「試料名、抵抗率、X線アナライザー角度、ID」の構造でフォルダ分けされている（ただしAuでは「試料名、X線アナライザー角度、ID」）。本デー...
Keyword:: SPring-8 BL15, Si, and XPS
Resource Type:: Dataset
Data origin:: experiments
Author:: SUMIYA, Masatomo
Date Uploaded:: 23/05/2024

Description/Abstract:: Recently Goto have done a precise measurement of transmission efficiency using a new method. Then, we have carried out the experimental d...
Keyword:: AES, IMFP, TPP-2M, and XPS
Resource Type:: Presentation
Author:: Tanuma，S, Okamoto, N, Azuma, Y, Kimura, T, and Goto, K
Date Uploaded:: 07/07/2023
Date Modified:: 07/07/2023

Description/Abstract:: The surface oxidation behavior of different GaN surfaces (the polar Ga-face (+c) and the nonpolar m-plane) under H<sub>2</sub>O vapor amb...
Keyword:: GaN, Gallium nitride, MOS structure, Oxidation, SPring-8, Surface oxidation, and XPS
Resource Type:: Dataset
Data origin:: other
Author:: SUMIYA, Masatomo
Date Uploaded:: 14/02/2023
Date Modified:: 28/02/2023

Description/Abstract:: The initial adsorption behavior of different GaN surfaces (the polar Ga-face (+c) and N-face (−c) and the nonpolar (101̅0) (m)-plane) und...
Keyword:: Adsorption, GaN, Gallium nitride, Oxidation, SPring-8, and XPS
Resource Type:: Dataset
Data origin:: other
Author:: SUMIYA, Masatomo
Date Uploaded:: 31/01/2023
Date Modified:: 28/02/2023

Description/Abstract:: ISO 18118 provides guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative ana...
Keyword:: AES, Auger electron spectroscopy, ISO, International Organization for Standardization, X-ray photoelectron spectroscopy, XPS, quantitative surface analysis, and relative sensitivity factor
Resource Type:: Article
Author:: TANUMA, Shigeo
Journal:: Surface and Interface Analysis
Date Uploaded:: 08/10/2020
Date Modified:: 01/07/2021

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