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Filtering by: Instrument managing organization Ritsumeikan University Remove constraint Instrument managing organization: Ritsumeikan University Instrument managing sub organization Ritsumeikan SR Center Remove constraint Instrument managing sub organization: Ritsumeikan SR Center Keyword Ritsumeikan-SR Remove constraint Keyword: Ritsumeikan-SR Keyword Si K-edge Remove constraint Keyword: Si K-edge

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XAFS spectrum of Quartz

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Quartz measured at Ritsumeikan-SR BL-13, and is a...

Keyword:

BL-13, Oxide, Quartz, Ritsumeikan-SR, Si K-edge, SiO2(quartz), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Muscovite

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Muscovite measured at Ritsumeikan-SR BL-10, and i...

Keyword:

Al2K2O6Si, BL-10, Muscovite, Ritsumeikan-SR, Si K-edge, Silicate, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Sodium orthosilicate

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Sodium orthosilicate measured at Ritsumeikan-SR B...

Keyword:

BL-10, Na4SiO4, Ritsumeikan-SR, Si K-edge, Silicate, Sodium orthosilicate, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Sodium metasilicate

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Sodium metasilicate measured at Ritsumeikan-SR BL...

Keyword:

BL-10, Na2SiO3, Ritsumeikan-SR, Si K-edge, Silicate, Sodium metasilicate, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon nitride

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon nitride measured at Ritsumeikan-SR BL-10,...

Keyword:

BL-10, Nitride, Ritsumeikan-SR, Si K-edge, Si3N4, Silicon nitride, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon carbide

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon carbide measured at Ritsumeikan-SR BL-10,...

Keyword:

BL-10, Carbide, Ritsumeikan-SR, Si K-edge, SiC, Silicon carbide, XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon dioxide (amorphous)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon dioxide (amorphous) measured at Ritsumeik...

Keyword:

BL-10, Oxide, Ritsumeikan-SR, Si K-edge, SiO2(amorphous), Silicon dioxide (amorphous), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon (powder)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (powder) measured at Ritsumeikan-SR BL-10...

Keyword:

BL-10, Pure metal, Ritsumeikan-SR, Si, Si K-edge, Silicon (powder), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon (wafer)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (wafer) measured at Ritsumeikan-SR BL-10,...

Keyword:

BL-10, Pure metal, Ritsumeikan-SR, Si, Si K-edge, Silicon (wafer), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022
XAFS spectrum of Silicon dioxide (Quartz)

Description/Abstract:

This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon dioxide (Quartz) measured at Ritsumeikan-...

Keyword:

BL-10, Oxide, Ritsumeikan-SR, Si K-edge, SiO2(quartz), Silicon dioxide (Quartz), XAFS, and collection - MDR XAFS DB

Resource Type:

Dataset

Data origin:

experiments

Date Uploaded:

08/06/2022

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Dataset10

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MDR XAFS DB10

Keyword

Ritsumeikan-SR[remove]10
Si K-edge[remove]10
XAFS10
collection - MDR XAFS DB10
BL-109
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Resource type

Dataset10

Visibility

open10

Rights Statement Sim

Creative Commons BY-NC-SA Attribution-NonCommercial-ShareAlike 4.0 International10

Data origin

experiments10

Characterization methods

spectroscopy -- x-ray absorption spectroscopy10

Instrument manufacturer

Ritsumeikan SR Center10

Instrument managing organization

Ritsumeikan University[remove]10

Instrument managing sub organization

Ritsumeikan SR Center[remove]10

Structural feature category

https://matvoc.nims.go.jp/entity/Q68610

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