Dataset
XAFS spectrum of Silicon (wafer)
MDR Open Deposited
- In Collection:
This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon (wafer) measured at Ritsumeikan-SR BL-10, and is a part of XAFS database (MDR XAFS DB, https://doi.org/10.48505/nims.1447) as a collection of MDR
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- Characterization methods
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- Chemical composition
- Structural feature
Items
Thumbnail | Title | Date Uploaded | Size | Visibility | Actions |
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19012411.dat | 29.4 KB | MDR Open |
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19012411.pfy | 5.01 KB | MDR Open |
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19012411.tey | 5.02 KB | MDR Open |
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BL10_Si-K_002_pfy.png | 20.7 KB | MDR Open |
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BL10_Si-K_002_tey.png | 21.7 KB | MDR Open |
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metadata.json | 15.2 KB | MDR Open |
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metadata.yml | 7.97 KB | MDR Open |
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primary.tsv | 14.3 KB | MDR Open |
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