Dataset

XAFS spectrum of Silicon carbide

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This dataset consists of X-ray absorption fine structure (XAFS) spectra at Si K-edge of Silicon carbide measured at Ritsumeikan-SR BL-10, and is a part of XAFS database (MDR XAFS DB,  https://doi.org/10.48505/nims.1447) as a collection of MDR

Description

DOI
Creator
Contact agent
  • Name
    Ritsumeikan SR Center
    Organization
    Ritsumeikan University
Keyword
Resource type
Data origin
Rights statement

Method

Instruments

Instrument
  • Title
    BL-10_XAFS
    Description
    Ritsumeikan SR Center Soft X-ray XAFS Beamline setup
    Instrument function
    Description
    x-ray absorption spectroscopy
    Manufacturer
    Organization
    Ritsumeikan SR Center
    Managing organization
    Organization
    Ritsumeikan University
    Sub organization
    Ritsumeikan SR Center

Specimen details

Specimen type
  • Title
    Silicon carbide
    Description
    powder, on carbon tape
Chemical composition
  • Description
    SiC
    Category
    https://matvoc.nims.go.jp/entity/Q2368
    Identifier - Local
    409-21-2
Structural feature
  • Description
    local structure
    Category
    https://matvoc.nims.go.jp/entity/Q686

Preview: primary.tsv

Items

Thumbnail Title Date Uploaded Size Visibility Actions
BL10_Si-K_006_pfy.png 20.2 KB MDR Open
BL10_Si-K_006_tey.png 21.5 KB MDR Open
SiC.dat 32.2 KB MDR Open
SiC.pfy 5.16 KB MDR Open
SiC.tey 5.24 KB MDR Open
metadata.json 15.1 KB MDR Open
metadata.yml 7.89 KB MDR Open
primary.tsv 14.2 KB MDR Open