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Experimental Determination of Electron Inelastic Mean Free Paths in 13 Elemental Solid...
Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at th...
試料冷却法を併用したAES深さ方向分析によるSiO2/Si熱酸化膜の分析
High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Hol...
Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids o...
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Auger Depth Profiling Analysis
3
GaAs/AlAs Superlattice
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Inclined Holder
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Si/Ge multiple delta-doped layers
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Japanese
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English
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Surface Analysis Society of Japan
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Wiley
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The Surface Science Society of Japan
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5
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Rights Statement Sim
In Copyright
3
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
2
Material/Specimen
41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi)
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C (graphite), Si, Cr, Fe, Cu, Zn, Ga, Mo, Ag, Ta, W, Pt and Au
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GaAs/AlAs Superlattice
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GaAs/AlAs Superlattice and Si/Ge multiple delta-doped layers
1
Si/Ge multiple delta-doped layers
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Date accepted
2015
1
Author
Tanuma, Shigeo
4
Ogiwara, Toshiya
3
Kim, Kyung Joong
2
Nagatomi, Takaharu
2
TANUMA, Shigeo
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Journal
Journal of Surface Analysis
1
Journal of Surface Analysis
1
Journal of The Surface Science Society of Japan
1
SURFACE AND INTERFACE ANALYSIS
1
Surface and Interface Analysis
1