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Filtering by: Type of work Publication Keyword transmission electron microscopy

Development of p-type Ion Implantation Technique for Realization of GaN Vertical MOSFETs

Quantitative Characterization by Transmission Electron Microscopy and Its Application ...

Latent ion tracks were finally observed in diamond

X線・中性子小角散乱法及び3次元アトムプローブ法による Cu-Ni-Si合金中のδNi2Si析出相の解析

Time-resolved imaging and analysis of the electron beam-induced formation of an open-c...

Au<sub>13</sub> Superatom Bearing Two Terpyridines at Coaxial Positions: P...

Atomic Diffusion of Indium through Threading Dislocations in InGaN Quantum Wells

Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implante...

[Research Highlights Vol.53] A New Way to Observe Heat Flows at Nanoscale