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Tanuma, Shigeo
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Calculations of Electron Inelastic Mean Free Paths (IMFPs). XIV. Calculated IMFPs for...
表面電子分光法における信号の減衰はいかに記述されるか? II. 誘電関数とIMFP
Calculations of electron inelastic mean free paths. XIII. Data for 14 organic compound...
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids o...
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP...
Experimental Determination of Electron Inelastic Mean Free Paths in 13 Elemental Solid...
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Ef...
Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at th...
InP/GaInAs多層膜のAES深さ方向分析のラウンドロビン試験報告(I)
試料冷却法を併用したAES深さ方向分析によるSiO2/Si熱酸化膜の分析
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Keyword
Auger Depth Profiling Analysis
6
IMFP
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electron inelastic mean free paths
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TPP-2M
4
Electron Inelastic Mean Free Path
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English
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Japanese
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Surface Analysis Society of Japan
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Wiley
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In Copyright
4
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
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Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
2
Material/Specimen
C (graphite), Si, Cr, Fe, Cu, Zn, Ga, Mo, Ag, Ta, W, Pt and Au
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26-n-paraffin
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GaAs
1
GaAs/AlAs Superlattice
1
GaAs/AlAs Superlattice and Si/Ge multiple delta-doped layers
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Date accepted
2002
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2004
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2017
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Date submitted
2021
1
Author
Tanuma, Shigeo
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17
Ogiwara, Toshiya
7
Shinotsuka, Hiroshi
4
Kim, Kyung Joong
2
Nagatomi, Takaharu
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https://creativecommons.org/licenses/by-nc-nd/4.0/
4
Journal
Journal of Surface Analysis
6
SURFACE AND INTERFACE ANALYSIS
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Surface and Interface Analysis
3
Journal of The Surface Science Society of Japan
2
Journal of Electron Spectroscopy and Related Phenomena
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