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Shigenori Ueda
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Approach to Low Contact Resistance Formation on Buried Interface in Oxide Thin-Film Transistors: Utilization of Palladium-Mediated Hydrogen Pathway
Description/Abstract:
Amorphous oxide semiconductors (AOSs) with low off-currents and processing temperatures offer promising alternative materials for next-ge...
Keyword:
IGZO
,
contact resistance
,
hydrogen
,
oxide semiconductors
,
palladium
, and
thin-film transistors
Resource Type:
Article
Author:
Yuhao Shi
,
Masatake Tsuji
,
Hanjun Cho
,
Shigenori Ueda
,
Junghwan Kim
, and
Hideo Hosono
Journal:
ACS Nano
Date Uploaded:
08/04/2024
Near-interface electronic and magnetic states of insulator/Co2MnSi structures probed by hard x-ray photoemission combined with x-ray total reflection
Description/Abstract:
Depth-dependent electronic and magnetic states of AlOx and MgO capped Co2MnSi thin films were measured by using hard X-ray photoemission ...
Keyword:
HAXPES
,
SX-ARPES
,
X-ray total reflection
,
insulator/Co2MnSi heterostructures
, and
interface and bulk electronic and magnetic states
Resource Type:
Article
Author:
Shigenori Ueda
,
Yuichi Fujita
, and
Yuya Sakuraba
Journal:
PHYSICAL REVIEW B
Date Uploaded:
13/02/2024
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HAXPES
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X-ray total reflection
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English
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APS
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Rights Statement Sim
Creative Commons BY Attribution 4.0 International
2
Author
Shigenori Ueda
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2
Hanjun Cho
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Hideo Hosono
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Junghwan Kim
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Masatake Tsuji
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Ministry of Education, Culture, Sports, Science and Technology
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Samsung Electronics Co, Ltd.
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ACS Nano
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PHYSICAL REVIEW B
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