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A universal Bayesian inference framework for complicated creep constitutive equations
Description/Abstract:
Evaluating the creep deformation process of heat-resistant steels is important for improving the energy efficiency of power plants by inc...
Keyword:
Materials science
,
Metals and alloys
, and
Structural materials
Resource Type:
Article
Author:
Mototake, Yoh-ichi
,
Izuno, Hitoshi
,
Nagata, Kenji
,
Demura, Masahiko
, and
Okada, Masato
Journal:
Scientific Reports
Date Uploaded:
15/07/2021
Date Modified:
01/11/2022
Combination of recommender system and single-particle diagnosis for accelerated discovery of novel nitrides
Description/Abstract:
Discovery of new compounds from wide chemical space is attractive for materials researchers. However, theoretical prediction and validati...
Keyword:
materials search
,
materials informatics
, and
density functional theory calculation
Material/Specimen:
nitrides
Resource Type:
Article
Author:
KOYAMA, Yukinori
,
SEKO, Atsuto
,
TANAKA, Isao
,
FUNAHASHI, Shiro
, and
HIROSAKI, Naoto
Journal:
The Journal of Chemical Physics
Date Uploaded:
15/06/2021
Date Modified:
24/06/2022
High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer
Description/Abstract:
半球型電子分光器を搭載したオージェ電子分光装置では,傾斜ホルダーを用いると装置のジオ メトリー特性との関係からイオン及び一次電子の入射角の自由度が大きくなる.特に試料回転の 回転軸が一次電子の入射方向と一致する場合は,傾斜ホルダーの回転角によってイオン入射角を 設定でき,電...
Keyword:
Auger Depth Profiling Analysis
,
Inclined Holder
,
GaAs/AlAs Superlattice
, and
Si/Ge multiple delta-doped layers
Material/Specimen:
GaAs/AlAs Superlattice
and
Si/Ge multiple delta-doped layers
Resource Type:
Article
Author:
Ogiwara, Toshiya
,
Nagatomi, Takaharu
,
Kim, Kyung Joong
, and
Tanuma, Shigeo
Journal:
Journal of Surface Analysis
Date Uploaded:
14/06/2021
Date Modified:
18/06/2021
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
Description/Abstract:
磁気ヘッド材料として用いられているFeNi:5 nm/CoFeB:3 nm/FeNi:10 nm多層薄膜の深さ方向組成分布を調べるために,極低角度入射イオンビームを用いたオージェ深さ方向分析によりイオン加速電圧0.5 kVおよび3.0 kVのスパッタ条件で分析を行った.その...
Keyword:
Auger Depth Profiling Analysis
,
Ultra Low Angle Incidence Ion Beam
, and
FeNi/CoFeB/FeNi Thin Film
Material/Specimen:
FeNi/CoFeB/FeNi Thin Film
Resource Type:
Article
Author:
Ogiwara, Toshiya
,
Yanagiuchi, Katsuaki
, and
Yoshikawa, Hideki
Journal:
Journal of Surface Analysis
Date Uploaded:
28/05/2021
Date Modified:
04/06/2021
Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
Description/Abstract:
各種化合物半導体の表面をArイオンでスパッタリングして,その表面のSEM観察を行なった.そして,イオンスパッタリング時の試料温度および試料回転の有無と表面形状の関係を系統的に調べた.その結果,表面あれはスパッタリングされた表面全体に生成する場合とコーン状の突起物がランダムに...
Keyword:
compound semiconductor
,
surface observation using a scanning electron microscope
, and
argon ion sputtering
Material/Specimen:
InP
,
InSb
,
InAs
,
GaAs
,
GaSb
, and
GaP
Resource Type:
Article
Author:
Ogiwara, Toshiya
and
Tanuma, Shigeo
Journal:
Journal of Surface Analysis
Date Uploaded:
28/05/2021
Date Modified:
04/06/2021
InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
Description/Abstract:
InP/GaInAsP多層膜を用いて,AES深さ方向分析における深さ分解能の試料温度依存性について検討を行なった.試料温度は,0〜50℃(10℃間隔)およびー120,−20℃の8条件としてデプスプロファイルを取得した.スパッタリング条件は,イオン種:Ar,イオン加速電圧:1...
Keyword:
InP/GaInAsP多層膜
,
Auger Depth Profiling Analysis
,
Depth Resolution
, and
Sample Temperature
Material/Specimen:
InP/GaInAsP Multilayer Film
Resource Type:
Article
Author:
Ogiwara, Toshiya
and
Tanuma, Shigeo
Journal:
Journal of Surface Analysis
Date Uploaded:
28/05/2021
Date Modified:
28/05/2021
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
Description/Abstract:
We have investigated the Auger depth profiling analysis of HfO2/Si by the glancing-angle ion beam sputtering method at an incident angle ...
Keyword:
Auger Depth Profiling analysis
,
HfO2/Si
, and
Ultra Low Angle Incidence Ion Beam
Material/Specimen:
HfO2
Resource Type:
Article
Author:
Yoshikawa, Hideki
,
Ogiwara, Toshiya
, and
Nagata, Takahiro
Journal:
Journal of Surface Analysis
Date Uploaded:
25/05/2021
Date Modified:
26/05/2021
Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm
Description/Abstract:
<h4>Abstract</h4> We have calculated inelastic mean free paths (IMFPs) for 41 elemental solids (Li, Be, graphite, diamond, glassy C, Na,...
Keyword:
electron inelastic mean free path
,
inelastic mean free paths
,
predictive equation for IMFP
,
elemental solid
,
relativistic Bethe equation
,
Fano plot
,
IMFP
,
ELF
,
energy loss function
,
optical constant
,
relativistic full Penn algorithm
,
full Penn algorithm
,
FPA
,
TPP-2M
, and
relativistic TPP-2M
Material/Specimen:
41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi)
Resource Type:
Article
Author:
Shinotsuka, Hiroshi
,
TANUMA, Shigeo
,
Powell, Cedric J.
, and
Penn, David R.
Journal:
Surface and Interface Analysis
Date Uploaded:
01/04/2021
Date Modified:
19/07/2021
Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python
Description/Abstract:
New programs for fitting using an equivalent circuit model and data visualization of electrochemical impedance spectroscopy were develope...
Keyword:
data visualization
,
electrochemical impedance
,
free software
, and
model fitting
Resource Type:
Article
,
Video
, and
Software or Program Code
Author:
SUZUKI, Tohru S.
and
KOBAYASHI, Kiyoshi
Journal:
Electrochemistry
Date Uploaded:
08/02/2021
Date Modified:
10/02/2021
SuperMat: Construction of a linked annotated dataset from superconductors-related publications
Description/Abstract:
A growing number of papers are published in the area of superconducting materials science. However, novel text and data mining (TDM) pro...
Keyword:
annotation
,
annotation guidelines
,
dataset
,
superconductors
, and
tdm
Resource Type:
Article
Author:
FOPPIANO, Luca
,
DIEB, Sae
,
SUZUKI, Akira
,
BAPTISTA DE CASTRO, Pedro
,
IWASAKI, Suguru
,
UZUKI, Azusa
,
ESPARZA ECHEVARRIA, Miren Garbine
,
MENG, Yan
,
TERASHIMA, Kensei
,
TAKANO, Yoshihiko
, and
ISHII, Masashi
Date Uploaded:
07/01/2021
Date Modified:
01/07/2021
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655
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Research Highlights
80
MANA E-BULLETIN
15
The history of DICE and NIMS Digital Library
10
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IMFP
17
nanomechanical sensors
13
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11
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573
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44
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42
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40
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39
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655
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In Copyright
281
Creative Commons BY Attribution 4.0 International
229
Creative Commons BY-NC-ND Attribution-NonCommercial-NoDerivs 4.0 International
47
Creative Commons BY-NC Attribution-NonCommercial 4.0 International
38
CC-BY-4.0
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»
Material/Specimen
HfO2
2
InP/GaInAsP multilayer specimens
2
41 elemental solids (Li, Be, graphite, diamond, glassy C, Na, Mg, Al, Si, K, Sc, Ti, V, Cr, Fe, Co, Ni, Cu, Ge, Y, Nb, Mo, Ru, Rh, Pd, Ag, In, Sn, Cs, Gd, Tb, Dy, Hf, Ta, W, Re, Os, Ir, Pt, Au, and Bi)
1
C (graphite), Si, Cr, Fe, Cu, Zn, Ga, Mo, Ag, Ta, W, Pt and Au
1
26-n-paraffin
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2002
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2005
6
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5
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5
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4
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Creator
TODOROKI, Shin-ichi
12
轟 眞市
9
INOUE, Satoru
8
田邉 浩介
2
MATSUMOTO, T.
1
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»
Author
International Center for Materials Nanoarchitectonics (WPI-MANA)
95
Ikumu Watanabe
28
Tanuma, Shigeo
18
Katsuhiko Ariga
17
Kosuke Minami
17
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MOTEKI, Fuma
1
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http://rightsstatements.org/vocab/InC/1.0/
14
https://creativecommons.org/licenses/by/4.0/
7
https://creativecommons.org/licenses/by-nc-nd/4.0/
4
https://creativecommons.org/licenses/by-nc/4.0/
2
http://opensource.org/licenses/MIT
1
Funder
Japan Society for the Promotion of Science
55
JSPS
43
JST
27
Japan Science and Technology Agency
19
Ministry of Education, Culture, Sports, Science and Technology
11
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Journal
Physical Review B
25
Science and Technology of Advanced Materials
13
JOURNAL OF APPLIED PHYSICS
11
Scientific Reports
11
Journal of Surface Analysis
10
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