Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface
- ジャーナル論文
- 著者
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Takahiro Nagata (author) (この著者で検索)
;
Asahiko Matsuda (author) (この著者で検索)
;
Takashi Teramoto (author) (この著者で検索)
https://orcid.org/0000-0002-9368-1284
(unauthenticated)
;
Dominic Gerlach (author) (この著者で検索)
https://orcid.org/0000-0003-1859-0750
(unauthenticated)
;
Peng Shen (author) (この著者で検索)
https://orcid.org/0000-0002-1971-5490
(unauthenticated)
;
Shigenori Ueda (author) (この著者で検索)
;
Takako Kimura (author) (この著者で検索)
https://orcid.org/0009-0007-0109-4482
(unauthenticated)
;
Christian Dussarrat (author) (この著者で検索)
https://orcid.org/0009-0000-1063-6473
(unauthenticated)
;
Toyohiro Chikyow (author) (この著者で検索)
- キーワード
- gallium nitride, GaN, nitrosyl fluoride, FNO, HAXPES, defect passivation, fluorination
- 刊行年月日
- 2025-03-07
- 更新時刻
- 2025-03-26 17:26:31 +0900
Effect of sequential N ion implantation in the formation of a shallow Mg-implanted p-type GaN layer
- ジャーナル論文
- 著者
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Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science Research Center for Magnetic and Spintronic Materials/Administrative Office
;
Jun Chen (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Optical Materials Field/Semiconductor Defect Design Group
;
;Ryo Tanaka (author) (この著者で検索)Fuji Electric Corporation;Shinya Takashima (author) (この著者で検索)Fuji Electric Corporation;Masaharu Edo (author) (この著者で検索)Fuji Electric CorporationTadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science Research Center for Magnetic and Spintronic Materials
;
Takashi Sekiguchi (author) (この著者で検索)University of Tsukuba
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy, cathodoluminescence
- 刊行年月日
- 2024-08-07
- 更新時刻
- 2024-08-03 08:30:15 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
- ジャーナル論文
- 著者
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Emi Kano (author) (この著者で検索)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
;
Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Koki Kobayashi (author) (この著者で検索);Kosuke Ishikawa (author) (この著者で検索);Kyosuke Sawabe (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
;Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2024-04-22
- 更新時刻
- 2024-09-20 16:30:27 +0900