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Revealing the Enhancement of Li Plating/Stripping Efficiency in the TEGDME-based Low-concentration Electrolytes for Anode-free Lithium Metal Batteries
- ジャーナル論文
- 著者
-
Yushen Wang (author) (この著者で検索)National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Interface Electrochemistry Group
;
Hidenori Noguchi (author) (この著者で検索)National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Interface Electrochemistry Group
- キーワード
- Anode-free lithium metal battery, TEGDME, Li plating/stripping efficiency, SEI layer structure
- 刊行年月日
- 2024-09-24
- 更新時刻
- 2025-09-24 08:30:28 +0900
Microsphere-assisted generation of localized optical emitters in 2D hexagonal boron nitride
- ジャーナル論文
- 著者
-
;Xiliang Yang (author) (この著者で検索);Dong Hoon Shin (author) (この著者で検索)Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
;
Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
;
;Peter G. Steeneken (author) (この著者で検索)Sabina Caneva (author) (この著者で検索)
- キーワード
- hexagonal boron nitride, microsphere, laser fabrication
- 刊行年月日
- 2025-06-05
- 更新時刻
- 2026-04-03 13:04:39 +0900
Lithium superionic behavior and defect robustness in LiNbOCl 4 : a first-principles molecular dynamics study
- ジャーナル論文
- 著者
-
Halimah Harfah (author) (この著者で検索)
https://orcid.org/0000-0002-7268-3758
(unauthenticated)
;
Yoshitaka Tateyama (author) (この著者で検索)
;
Kazunori Takada (author) (この著者で検索)
;
Randy Jalem (author) (この著者で検索)
- キーワード
- all solid state batteries, solid electrolytes, first-principles calculations, ab initio molecular dynamics siumulations
- 刊行年月日
- 2026-03-06
- 更新時刻
- 2026-07-10 16:38:15 +0900
Reducing critical current for spin-transfer-torque magnetization reversal in current-perpendicular-to-plane giant magnetoresistance devices using low damping and spin scattering asymmetry in Co2FeGa0.5Ge0.5 Heusler alloy
- ジャーナル論文
- 著者
-
;Vineet Barwal (author) (この著者で検索)Hirofumi Suto (author) (この著者で検索)
;
Yuya Sakuraba (author) (この著者で検索)
- キーワード
- Heusler alloys, Giant magnetoresistance, Spin-transfer-torque, Ferromagnetic resonance, Gilbert damping
- 刊行年月日
- 2025-12-18
- 更新時刻
- 2026-02-11 12:30:10 +0900
High Thermoelectric Performance in Al- and Sn-Codoped ZnO Nanosheets via Synergistic Band Structure Engineering with Low Thermal Conductivity
- ジャーナル論文
- 著者
-
;Althaf RajaMohamed (author) (この著者で検索)Hyoung-Won Son (author) (この著者で検索)National Institute for Materials Science
;
Takao Mori (author) (この著者で検索)National Institute for Materials Science
;
Anuradha M. Ashok (author) (この著者で検索)
- キーワード
- thermoelectric
- 刊行年月日
- 2025-07-14
- 更新時刻
- 2025-11-10 12:30:09 +0900
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
- ジャーナル論文
- 著者
-
Ogiwara, Toshiya (author) (この著者で検索)
;
Nagata, Takahiro (author) (この著者で検索)
;
Yoshikawa, Hideki (author) (この著者で検索)
- キーワード
- Auger Depth Profiling Analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
- 刊行年月日
- 2020-06-04
- 更新時刻
- 2022-10-03 01:48:14 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900