4 件のレコードが見つかりました。
Machine learning assisted nanobeam X-ray diffraction based analysis on hydride vapor-phase epitaxy GaN
- ジャーナル論文
- 著者
-
;Zhendong Wu (author) (この著者で検索)Yusuke Hayashi (author) (この著者で検索)National Institute for Materials Science
;
;Tetsuya Tohei (author) (この著者で検索);Kazushi Sumitani (author) (この著者で検索);Yasuhiko Imai (author) (この著者で検索);Shigeru Kimura (author) (この著者で検索)Akira Sakai (author) (この著者で検索) - キーワード
- GaN, SPring-8, nanoXRD, Machine learning
- 刊行年月日
- 2025-08-01
- 更新時刻
- 2025-07-31 12:30:18 +0900
Impacts of vacancy complexes on the room-temperature photoluminescence lifetime of state-of-the-art GaN substrates, epitaxial layers, and Mg-implanted layers
- ジャーナル論文
- 著者
-
;Shigefusa F. Chichibu (author) (この著者で検索)Institute of Multidisciplinary Research for Advanced Materials, Tohoku University;Kohei Shima (author) (この著者で検索)Institute of Multidisciplinary Research for Advanced Materials, Tohoku University;Akira Uedono (author) (この著者で検索)Department of Pure and Applied Sciences, University of Tsukuba, Tsukuba, Ibaraki 305-8573, Japan;Shoji Ishibashi (author) (この著者で検索)AIST;Hiroko Iguchi (author) (この著者で検索)TOYOTA CENTRAL R&D LABS., INC.;Tetsuo Narita (author) (この著者で検索)TOYOTA CENTRAL R&D LABS., INC.;Keita Kataoka (author) (この著者で検索)TOYOTA CENTRAL R&D LABS., INC.;Ryo Tanaka (author) (この著者で検索)Fuji Electric Corporation;Shinya Takashima (author) (この著者で検索)Fuji Electric Corporation;Katsunori Ueno (author) (この著者で検索)Fuji Electric Corporation;Masaharu Edo (author) (この著者で検索)Fuji Electric Corporation;Hirotaka Watanabe (author) (この著者で検索)Institute of Materials and Systems for Sustainability, Nagoya University;Atsushi Tanaka (author) (この著者で検索)Institute of Materials and Systems for Sustainability, Nagoya University;Yoshio Honda (author) (この著者で検索)Institute of Materials and Systems for Sustainability, Nagoya University;Jun Suda (author) (この著者で検索)Institute of Materials and Systems for Sustainability, Nagoya University;Hiroshi Amano (author) (この著者で検索)Institute of Materials and Systems for Sustainability, Nagoya University;Tetsu Kachi (author) (この著者で検索)Institute of Materials and Systems for Sustainability, Nagoya UniversityToshihide Nabatame (author) (この著者で検索)National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)
;
Yoshihiro Irokawa (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Next-generation Semiconductor Group
;
Yasuo Koide (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Next-generation Semiconductor Group
- キーワード
- GaN
- 刊行年月日
- 2024-05-14
- 更新時刻
- 2024-05-09 16:30:16 +0900
Vacancy-type defects introduced by mechanical polishing in ammonothermal GaN studied by a monoenergetic positron beam
- ジャーナル論文
- 著者
-
Akira Uedono (author) (この著者で検索)
https://orcid.org/0000-0001-6224-4869
(unauthenticated)
;
Shoji Ishibashi (author) (この著者で検索)
https://orcid.org/0000-0002-4896-3530
(unauthenticated)
;
Kohei Shima (author) (この著者で検索)
https://orcid.org/0000-0003-0967-141X
(unauthenticated)
;
;Shigefusa F. Chichibu (author) (この著者で検索)Kacper Sierakowski (author) (この著者で検索)
https://orcid.org/0000-0002-9447-1182
(unauthenticated)
;
Makoto Oishi (author) (この著者で検索)
https://orcid.org/0000-0003-3402-4556
(unauthenticated)
;
Noriyuki Okada (author) (この著者で検索)
https://orcid.org/0009-0002-0090-5646
(unauthenticated)
;
Takuro Nagai (author) (この著者で検索)
;
Michal Bockowski (author) (この著者で検索)
https://orcid.org/0000-0003-1616-685X
(unauthenticated)
- キーワード
- Mechanical polishing, GaN, Vacancy, Defect, Positron annihilation
- 刊行年月日
- 2026-04-12
- 更新時刻
- 2026-04-20 08:56:29 +0900
Formation of GaN mesas with reverse-tapered edge structures on a lattice-matched AlInN layer for a positive beveled edge termination
- ジャーナル論文
- 著者
-
Takayoshi Oshima (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Ultra-wide Bandgap Semiconductors Group
;
Masataka Imura (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Next-generation Semiconductor Group
;
Yuichi Oshima (author) (この著者で検索)National Institute for Materials Science Research Center for Electronic and Optical Materials/Functional Materials Field/Ultra-wide Bandgap Semiconductors Group
- キーワード
- GaN, AlInN, etching, positive bevel edge termination
- 刊行年月日
- 2024-08-01
- 更新時刻
- 2024-08-02 12:30:52 +0900