3 件のレコードが見つかりました。
Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN
- ジャーナル論文
- 著者
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;Kosuke Ishikawa (author) (この著者で検索)Emi Kano (author) (この著者で検索)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
;
Jun Uzuhashi (author) (この著者で検索)
;
;Kensuke Sumida (author) (この著者で検索)Tetsuo Narita (author) (この著者で検索)
https://orcid.org/0000-0002-0849-360X
(unauthenticated)
;
Masahiro Horita (author) (この著者で検索)
https://orcid.org/0000-0003-0008-6732
(unauthenticated)
;
;Junya Sahashi (author) (この著者で検索)Shun Lu (author) (この著者で検索)
https://orcid.org/0000-0002-7342-757X
(unauthenticated)
;
Jun Suda (author) (この著者で検索)
https://orcid.org/0000-0002-5453-4943
(unauthenticated)
;
Tadakatsu Ohkubo (author) (この著者で検索)
;
Tetsu Kachi (author) (この著者で検索)
https://orcid.org/0000-0002-4300-5720
(unauthenticated)
;
Nobuyuki Ikarashi (author) (この著者で検索)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- キーワード
- gallium nitride, atom probe tomography
- 刊行年月日
- 2026-06-22
- 更新時刻
- 2026-06-25 09:46:49 +0900
Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN
- ジャーナル論文
- 著者
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Emi Kano (author) (この著者で検索)
https://orcid.org/0000-0001-6134-4980
(unauthenticated)
;
Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Koki Kobayashi (author) (この著者で検索);Kosuke Ishikawa (author) (この著者で検索);Kyosuke Sawabe (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
;Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
https://orcid.org/0000-0002-5575-5780
(unauthenticated)
- キーワード
- gallium nitride, atom probe tomography, transmission electron microscopy
- 刊行年月日
- 2024-04-22
- 更新時刻
- 2024-09-20 16:30:27 +0900
Atomic resolution analysis of extended defects and Mg agglomeration in Mg-ion-implanted GaN and their impacts on acceptor formation
- ジャーナル論文
- 著者
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;Emi Kano (author) (この著者で検索);Keita Kataoka (author) (この著者で検索)Jun Uzuhashi (author) (この著者で検索)National Institute for Materials Science
;
;Kenta Chokawa (author) (この著者で検索);Hideki Sakurai (author) (この著者で検索);Akira Uedono (author) (この著者で検索);Tetsuo Narita (author) (この著者で検索);Kacper Sierakowski (author) (この著者で検索);Michal Bockowski (author) (この著者で検索);Ritsuo Otsuki (author) (この著者で検索);Koki Kobayashi (author) (この著者で検索);Yuta Itoh (author) (この著者で検索);Masahiro Nagao (author) (この著者で検索)Tadakatsu Ohkubo (author) (この著者で検索)National Institute for Materials Science
;
Kazuhiro Hono (author) (この著者で検索)National Institute for Materials Science
;
;Jun Suda (author) (この著者で検索);Tetsu Kachi (author) (この著者で検索)Nobuyuki Ikarashi (author) (この著者で検索)
- キーワード
- gallium nitride, transmission electron microscopy, atom probe tomography
- 刊行年月日
- 2022-08-14
- 更新時刻
- 2024-01-05 22:13:58 +0900