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論文・データセット
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ジャーナル論文(5)
キーワード
Auger Depth Profiling Analysis (5)
Ultra Low Angle Incidence Ion Beam (2)
Argon Ion Spot Beam (1)
FeNi/CoFeB/FeNi Thin Film (1)
GaAs/AlAs Superlattice (1)
HfO2/Si (1)
InP/GaInAsP Multilayer Specimen (1)
InP/GaInAsP Multilayers (1)
Inclined Holder (1)
Sample Cooling Method (1)
(more)
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ファイル種別
application/pdf (5)
キーワード: Auger Depth Profiling Analysis
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5 件のレコードが見つかりました。
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
ジャーナル論文
著者
Ogiwara, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
NIMS Researchers Directory SAMURAI
Ogiwara, Toshiya
;
Yanagiuchi, Katsuaki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3882-8052
(unauthenticated)
Yanagiuchi, Katsuaki
;
Yoshikawa, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
NIMS Researchers Directory SAMURAI
Yoshikawa, Hideki
キーワード
Ultra Low Angle Incidence Ion Beam
,
FeNi/CoFeB/FeNi Thin Film
,
Auger Depth Profiling Analysis
刊行年月日
2019-03-31
更新時刻
2024-01-05 22:13:23 +0900
English Translation of J. Surf. Anal. 24, 192-205(2018), Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
ジャーナル論文
著者
Ogiwara, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
NIMS Researchers Directory SAMURAI
Ogiwara, Toshiya
;
Nagata, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
NIMS Researchers Directory SAMURAI
Nagata, Takahiro
;
Yoshikawa, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
NIMS Researchers Directory SAMURAI
Yoshikawa, Hideki
キーワード
Auger Depth Profiling Analysis
,
HfO2/Si
,
Ultra Low Angle Incidence Ion Beam
刊行年月日
2020-06-04
更新時刻
2022-10-03 01:48:14 +0900
Ultra High Depth Resolution Auger Depth Profiling by Both Electron and Ion Beams at the Glancing Incidence using an Inclined Specimen Holder
ジャーナル論文
著者
Ogiwara, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
NIMS Researchers Directory SAMURAI
Ogiwara, Toshiya
;
Nagatomi, Takaharu
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3629-638X
(unauthenticated)
Nagatomi, Takaharu
;
Kim, Kyung Joong
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5559-9784
(unauthenticated)
Kim, Kyung Joong
;
Tanuma, Shigeo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
キーワード
Auger Depth Profiling Analysis
,
Si/Ge multiple delta-doped layers
,
GaAs/AlAs Superlattice
,
Inclined Holder
刊行年月日
2011-10-24
更新時刻
2024-01-05 22:14:10 +0900
Depth Profiling Analysis of InP/GaInAsP Multilayers by Auger Electron Spectroscopy. Effects of Zalar Rotation and Liquid Nitrogen Cold Stage
ジャーナル論文
著者
Ogiwara, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
NIMS Researchers Directory SAMURAI
Ogiwara, Toshiya
;
Tanuma, Shigeo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
Tanuma, Shigeo
;
Nagasawa, Yuji
(author) (
この著者で検索
)
Nagasawa, Yuji
;
Ikeo, Nobuyuki
(author) (
この著者で検索
)
Ikeo, Nobuyuki
キーワード
Auger Depth Profiling Analysis
,
InP/GaInAsP Multilayers
,
Zalar Rotation Method
,
Sample Cooling Method
刊行年月日
2011-06-10
更新時刻
2022-10-03 01:53:08 +0900
Depth Profiling Analysis of InP/GaInAsP Multilayer Structure with Auger Electron Spectroscopy by Using Argon Ion Spot Beam
ジャーナル論文
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
HARADA, Tomoko
(author) (
この著者で検索
)
HARADA, Tomoko
;
TANUMA, Shigeo
(author) (
この著者で検索
)
https://orcid.org/0000-0003-2628-9941
NIMS Researchers Directory SAMURAI
TANUMA, Shigeo
キーワード
Auger Depth Profiling Analysis
,
InP/GaInAsP Multilayer Specimen
,
Argon Ion Spot Beam
刊行年月日
2011-06-10
更新時刻
2022-10-03 02:04:45 +0900
キーワード
Auger Depth Profiling Analysis
(5)
Ultra Low Angle Incidence Ion Beam
(2)
Argon Ion Spot Beam
(1)
FeNi/CoFeB/FeNi Thin Film
(1)
GaAs/AlAs Superlattice
(1)
HfO2/Si
(1)
InP/GaInAsP Multilayer Specimen
(1)
InP/GaInAsP Multilayers
(1)
Inclined Holder
(1)
Sample Cooling Method
(1)
Si/Ge multiple delta-doped layers
(1)
Zalar Rotation Method
(1)
RDEメタデータ定義
RDE送り状
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1
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