5 件のレコードが見つかりました。
Effects of nitrosyl fluoride based gas treatment on fluorination and redox reaction at GaN surface and Pt/GaN interface
- ジャーナル論文
- 著者
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Takahiro Nagata (author) (この著者で検索)
;
Asahiko Matsuda (author) (この著者で検索)
;
Takashi Teramoto (author) (この著者で検索)
https://orcid.org/0000-0002-9368-1284
(unauthenticated)
;
Dominic Gerlach (author) (この著者で検索)
https://orcid.org/0000-0003-1859-0750
(unauthenticated)
;
Peng Shen (author) (この著者で検索)
https://orcid.org/0000-0002-1971-5490
(unauthenticated)
;
Shigenori Ueda (author) (この著者で検索)
;
Takako Kimura (author) (この著者で検索)
https://orcid.org/0009-0007-0109-4482
(unauthenticated)
;
Christian Dussarrat (author) (この著者で検索)
https://orcid.org/0009-0000-1063-6473
(unauthenticated)
;
Toyohiro Chikyow (author) (この著者で検索)
- キーワード
- gallium nitride, GaN, nitrosyl fluoride, FNO, HAXPES, defect passivation, fluorination
- 刊行年月日
- 2025-03-07
- 更新時刻
- 2025-03-26 17:26:31 +0900
Temperature- and depth-dependent valence band electronic structures of half-metallic studied by hard x-ray photoemission spectroscopy
- ジャーナル論文
- 著者
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Shigenori Ueda (author) (この著者で検索)
;
Yuichi Fujita (author) (この著者で検索)
;
Ivan Kurniawan (author) (この著者で検索)
;
Yuya Sakuraba (author) (この著者で検索)
;
Yoshio Miura (author) (この著者で検索)
- キーワード
- Co2MnSi, HAXPES, Temperature dependence, Interface and bulk electronic states, interface and bulk magnetic properties, X-ray polarization dependence
- 刊行年月日
- 2026-02-18
- 更新時刻
- 2026-02-21 08:30:04 +0900
Direct Analysis of Stacked Au/Ti/In2O3/Al2O3/p+-Si Transport Mechanisms Using Operando Hard X-ray Photoelectron Spectroscopy
- ジャーナル論文
- 著者
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Ibrahima Gueye (author) (この著者で検索)
https://orcid.org/0000-0001-5296-3894
(unauthenticated)
National Institute for Materials Science
;
Shigenori Ueda (author) (この著者で検索)National Institute for Materials Science
;
;Atsushi Ogura (author) (この著者で検索)Takahiro Nagata (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Operando, HAXPES, Interfaces, In2O3, Al2O3, Band bending, Chemical-structures
- 刊行年月日
- 2024-05-28
- 更新時刻
- 2025-05-15 08:30:10 +0900
Electron trapping/detrapping at oxygen vacancies and imprint evolution in La-doped Hf0.5Zr0.5O2 ferroelectric capacitors probed by hard x-ray photoelectron spectroscopy
- ジャーナル論文
- 著者
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W. Hamouda (author) (この著者で検索)
https://orcid.org/0000-0002-7055-7264
(unauthenticated)
;
Y. Yamashita (author) (この著者で検索)
;
S. Ueda (author) (この著者で検索)
;
S. Matzen (author) (この著者で検索)
https://orcid.org/0000-0002-4244-6516
(unauthenticated)
;
O. Renault (author) (この著者で検索)
https://orcid.org/0000-0002-0683-9590
(unauthenticated)
;
F. Mehmood (author) (この著者で検索)
https://orcid.org/0000-0002-9530-380X
(unauthenticated)
;
T. Mikolajick (author) (この著者で検索)
https://orcid.org/0000-0003-3814-0378
(unauthenticated)
;
U. Schroeder (author) (この著者で検索)
https://orcid.org/0000-0002-6824-2386
(unauthenticated)
;
N. Barrett (author) (この著者で検索)
https://orcid.org/0000-0002-8228-0805
(unauthenticated)
- キーワード
- Hf0.5Zr0.5O2, HAXPES, operando
- 刊行年月日
- 2025-11-03
- 更新時刻
- 2025-11-13 12:30:12 +0900
Chemical Interface Structures in CdS/RbInSe2/Cu(In,Ga)Se2 Thin‐Film Solar Cell Stacks
- ジャーナル論文
- 著者
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Jakob Bombsch (author) (この著者で検索)
https://orcid.org/0000-0002-0820-162X
(unauthenticated)
;
Tim Kodalle (author) (この著者で検索)
https://orcid.org/0000-0002-8792-9669
(unauthenticated)
;
Raul Garcia‐Diez (author) (この著者で検索)
https://orcid.org/0009-0000-9374-1083
(unauthenticated)
;
;Claudia Hartmann (author) (この著者で検索);Roberto Félix (author) (この著者で検索)Shigenori Ueda (author) (この著者で検索)
;
Regan G. Wilks (author) (この著者で検索)
https://orcid.org/0000-0001-5822-8399
(unauthenticated)
;
Christian A. Kaufmann (author) (この著者で検索)
https://orcid.org/0000-0001-9168-2032
(unauthenticated)
;
Marcus Bär (author) (この著者で検索)
https://orcid.org/0000-0001-8581-0691
(unauthenticated)
- キーワード
- Thin-film solar cell stack, interface, Chemical analysis, hard X-ray photoemission spectroscopy, HAXPES
- 刊行年月日
- 2024-05-06
- 更新時刻
- 2024-08-01 16:30:13 +0900