ジャーナル論文 Chemical Interface Structures in CdS/RbInSe2/Cu(In,Ga)Se2 Thin‐Film Solar Cell Stacks
Jakob Bombsch (author) (この著者で検索)
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Tim Kodalle (author) (この著者で検索)
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Raul Garcia‐Diez (author) (この著者で検索)
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Claudia Hartmann (author) (この著者で検索)
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Roberto Félix (author) (この著者で検索)
; ORCID SAMURAI ;
Regan G. Wilks (author) (この著者で検索)
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Christian A. Kaufmann (author) (この著者で検索)
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Marcus Bär (author) (この著者で検索)
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コレクション

引用
Jakob Bombsch, Tim Kodalle, Raul Garcia‐Diez, Claudia Hartmann, Roberto Félix, Shigenori Ueda, Regan G. Wilks, Christian A. Kaufmann, Marcus Bär. Chemical Interface Structures in CdS/RbInSe2/Cu(In,Ga)Se2 Thin‐Film Solar Cell Stacks. Advanced Functional Materials. 2024, (), 2403685. https://doi.org/10.1002/adfm.202403685
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説明:

(abstract)

Heavy alkali – based post-deposition treatments (PDT) of Cu(In,Ga)Se2 (CIGSe) thin-film solar cells absorbers often result in an performance enhancement. Employing an RbF PDT in some cases induces the formation of an Rb-In-Se phase on the CIGSe surface. Mimicking this effect, recently the direct deposition of an interfacial RbInSe2 (RISe) layer between buffer and absorber was suggested and realized by co-evaporation; also benefitting cell performance. In order to clarify the beneficial effect, we performed a detailed analysis of the chemical interface structures in CdS/RISe/CIGSe layer stacks using hard X-ray photoelectron spectroscopy (HAXPES). When aiming for the direct co-evaporation of a RISe layer on the CIGSe absorber, we find the formation of an additional In-Se phase. For the RbF PDT CIGSe absorbers, we only find small amounts of Rb and no indication for a RISe layer formation. Examining layer stacks prepared via additional chemical bath deposition (CBD) of CdS reveals a clear impact of the presence of Rb on the CIGSe surface. In these cases, we find an increase of the induction/coalescence period at the beginning of the CBD buffer layer growth process and the formation of Cd-Se bonds; thereafter, a more compact CdS layer growth is observed.

権利情報:

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キーワード: Thin-film solar cell stack, interface, Chemical analysis, hard X-ray photoemission spectroscopy, HAXPES

刊行年月日: 2024-05-06

出版者: Wiley

掲載誌:

  • Advanced Functional Materials (ISSN: 1616301X) 2403685

研究助成金:

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1002/adfm.202403685

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更新時刻: 2024-08-01 16:30:13 +0900

MDRでの公開時刻: 2024-08-01 16:30:13 +0900

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